TEM (JEOL JEM 2100F) instrument was operated at accelerating voltage of 200 kV to record the surface morphology of Rh(0)NPs/Fullerene-C60. Park System model XE100 AFM was used to capture the 1D and 3D AFM images of fullerene-C60 and Rh(0)NPs/Fullerene-C60 in a non-contact mode. Metal loading and elements present in Rh(0)NPs/Fullerene-C60 were determined by EDS analysis (Hitachi 3000H SEM). Crystalline property of samples was studied by using XRD (Rigaku Ultima XRD) and the Raman spectra were recorded on LabRam ARAMIS IR2. Chemical property of the fullerene-C60 and Rh(0)NPs/Fullerene-C60 was investigated by XPS analysis using a Kratos Axis-Ultra DLD, Kratos Analytical Ltd, Japan. FTIR (IR Prestige-21, Shimadzu, Japan) spectra were recorded for both fullerene-C60 and Rh(0)NPs/Fullerene-C60. Catalytic performance of fullerene-C60 and Rh(0)NPs/Fullerene-C60 was studied by UV-vis (Shimadzu UV-2600 spectrophotometer) spectra and GC analysis (Shimadzu-2010 gas chromatograph). NMR (400 MHz Bruker spectrometer) spectra were recorded for the catalytic products.
3000h sem
Manufactured by Hitachi
The 3000H SEM is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed to provide high-resolution images of sample surfaces by scanning them with a focused beam of electrons. The 3000H SEM features a high-performance electron optical column and advanced imaging capabilities, allowing for detailed analysis of a wide range of materials and samples.
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2 protocols using 3000h sem
1
Characterization and Catalytic Evaluation of Rh Nanoparticles on Fullerene-C60
2
Characterization of CuNi/Graphene Oxide Catalysts
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HRTEM (JEOL JEM-2100F) and AFM (Park System model XE100 AFM) were employed to study the surface morphology of CuNi/GO-I and CuNi/GO-II. HRTEM was operated at accelerating voltage of 200 kV and a non-contact mode was opted to recode the AFM imaging. Loading of Cu and Ni was found out by recording SEM-EDS (Hitachi 3000 H SEM). To study the metal-support interaction and crystalline properties, Raman spectra (Hololab 5000, Kaiser Optical Systems Inc., USA) and powder XRD (Rotaflex RTP300 (Rigaku Co., Japan) were recorded for CuNi/GO-I and CuNi/GO-II. XPS spectra (Kratos Axis-Ultra DLD, Kratos Analytical Ltd, Japan) were recorded for fresh GO, CuNi/GO-I and CuNi/GO-II. Surface area, pore size and pore volume of the fresh GO, CuNi/GO-I and CuNi/GO-II were calculated by BET method (BELSORP-max; BEL Japan, Inc.). Catalytic performance of CuNi/GO-I and CuNi/GO-II towards reduction of nitropehnol was studied by using Ultraviolet-visible (UV-vis, Shimadzu UV-2600 spectrophotometer). Yield of the catalytic products were determined by gas chromatograph (GC, Shimadzu-2010 gas chromatograph). Nuclear magnetic resonance (NMR) spectra were recorded on a 400 MHz Bruker spectrometer in CDCl3 using tetramethylsilane (TMS) as a standard.
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