Ntegra spm

The surface morphologies of the 100 nm continuous tetracene thin film and tetracene thin films that had been reacted for 8 h with maleic anhydride were analyzed using atomic force microscopy. The thin films were imaged in air with NTEGRA SPM (NT-MDT Spectrum Instruments, Moscow, Russia). The instrument was operated in Amplitude Modulation (tapping) mode using Si AFM cantilevers (NSG10, NT-MDT Spectrum Instruments) with a nominal tip radius of 6 nm. The images were collected at scan rate of 1 Hz and are 512 × 512 points. The root-mean-square (rms) roughness of the thin films (both pure tetracene and 8 h maleic anhydride tetracene adduct) was calculated from the obtained topography images using Image Analyses software (NTEGRA SPM (NT-MDT Spectrum Instruments)).

The topographical analysis of the prepared samples was carried out by an NT-MDT NTEGRA SPM (Moscow, Russia) AFM in non-contact mode. Silicon nitride non-contact cantilevers with gold coating on the reflective side (NT-MDT, NSG03) and resonance frequencies between 50 and 150 kHz were used. The tips spring constant is between 0.35 and 6.06 N m⁻¹, as measured by the Sader method.^{25 (link)} The amplitude of oscillation was 10 nm, and the scan rate for 5 μm × 5 μm images was 1.0 Hz. The scanner used had a maximum range of 100 μm and was calibrated in x, y and z directions using 1.5 μm standard grids with a height of 22 nm.