Su8020 sem
The SU8020 SEM is a scanning electron microscope designed and manufactured by Hitachi. It is a high-performance instrument used for the observation and analysis of various samples at the micro and nanoscale. The SU8020 SEM provides high-resolution imaging capabilities, enabling users to explore the detailed structure and characteristics of their samples.
Lab products found in correlation
9 protocols using su8020 sem
Silkworm Hemocyte Response to Dopamine
Characterization of Advanced Materials
Scanning Electron Microscopy of Bacteria
Characterization of Synthetic Iron Oxide Nanoparticles
where the Scherrer constant K is 0.89, B is the full width at half maximum of the sharp peaks, γ is the wavelength of X-ray diffraction, and θ is the measured diffraction angle (Vinila et al., 2014 (link)).
Microstructural Analysis of IPC-DNV-TSG Gel
Cellular Morphology Examination by SEM
Morphological and Ultrastructural Changes in Pancreatic Cancer Cells
Characterization of Ceramic Membranes
Investigating VRE-fm Cell Morphology with EFAs
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