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Titan 80 300 environmental tem

Manufactured by Thermo Fisher Scientific

The Titan 80-300 environmental TEM is a transmission electron microscope designed for advanced materials analysis. It is capable of operating at accelerating voltages between 80 and 300 kilovolts. The instrument provides high-resolution imaging and spectroscopy capabilities for studying samples in a controlled gaseous environment.

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2 protocols using titan 80 300 environmental tem

1

In Situ TEM Lithiation of QMS Particles

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The in situ TEM measurements were performed in Titan 80-300 environmental TEM (FEI) at the acceleration voltage of 300 kV using a dual-probe electrical biasing holder (Nanofactory Instruments). The QMS (or Si) particles were drop-cast onto a gold wire as a working electrode, while a piece of lithium was attached to a tungsten rod served as the counter electrode. During the transfer of the holder into the TEM, the Li metal was shortly exposed to air for about 3 s to create a thin Li2O layer acting as a solid electrolyte. A constant potential of ±3 V was applied to the QMS (or Si) electrodes against the Li metal during lithiation and delithiation, whereby Li-ion was inserted and extracted through the solid electrolyte. It does not make sense for us to estimate the ion conductivity of particle itself during in situ TEM analysis, because it was measured using the lithium oxide solid electrolyte and each measurement had a different voltage bias depending on its size and contact features. Nevertheless, the QMS particles can be lithiated faster than that of Si even with a lower bias of −3 V as compared with our previous report7 (link).
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2

Multimodal Microscopy for Material Characterization

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FIB/SEM imaging and TEM specimen preparation by FIB lift out were conducted on a FEI Helios DualBeam FIB operating at 1–30 kV. STEM observation was conducted on FEI Titan 80-300 TEM with probe corrector. In STEM mode the beam current is 60 pA. For high-resolution lattice imaging, the beam dose is around 106 e Å–2. HRTEM observations were conducted on FEI Titan 80-300 Environmental TEM with objective lens corrector. The beam current is 140 pA. The in situ TEM heating holder is carried using a double tilt holder based on resistant heating coil made by Gatan (Gatan Inc., Pleasanton, CA, USA). The sample was heated at a constant rate of 5 °C min–1 from room temperature and the temperature is measured using a thermal couple integrated into the holder. In situ XRD experiments were carried out using a Bruker D8 advace X-ray diffractometer with a heating stage.
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