Smile view software
SMILE VIEW software is a data processing and analysis tool developed by JEOL. It provides functionalities for visualizing and analyzing data generated from various JEOL laboratory equipment.
Lab products found in correlation
4 protocols using smile view software
Coral Skeleton Morphometry Analysis
Investigating Brassinosteroid Regulation of Xylem Formation
To analyze the responsiveness of BRs or auxin with BRs on xylem formation, at least three independent lines of root-removed control and transgenic seedlings were grown on the 1/2 MS medium with or without PCZ/(PCZ + IBA) at various determined concentrations for 21 days (8 h for gene expression analysis), and 0.3-cm segments were taken from their basal stems. These segments were fixed in 4% paraformaldehyde (Sigma-Aldrich) at 4°C for 4 days, dehydrated in graded ethanol series, and embedded into paraplast. The 5-μm sections were obtained using a Leica RM2235 rotary microtome and adhered to Superfrost microscope slides (Thermo). The sections were stained with 0.1% toluidine blue and observed using an Olympus X51 light microscope (Olympus). Radial widths of xylem were measured in three independent replicates using the SmileView software (JEOL).
3D-Printed PLGA Scaffold Fabrication
Ultrastructural Analysis of Fungal Hyphae
For SEM analysis, hyphae were cultured on PDA medium at 37 °C for 48 hr, and agar blocks containing fungal cells were fixed as described for the transmission electron microscopy analysis. The blocks were then dehydrated by passage through a graded series of ethanol solutions, replaced with isoamyl acetate, and dried using the critical‐point method (EM CPD030; Leica, Germany). After sputter coating with platinum‐palladium (using an E102 Ion sputter; Hitachi, Japan), samples were visualised using an S‐3400 SEM (Hitachi, Japan). The proportion of spike area to the total surface area of each conidium was measured using Image J. For field emission‐scanning electron microscopy analysis, dehydrated samples were visualised on poly‐L‐lysine coated silicon wafers under CrossBeam 550 (Zeiss).
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