The specimens were placed in aluminum stubs, covered with gold/palladium (Desk II—Denton Vacuum) and were examined in a scanning electron microscope (JMS 5310—Jeol).
Jms 5310
The JMS 5310 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The JMS 5310 features a high-performance electron optical system and advanced imaging capabilities.
Lab products found in correlation
2 protocols using jms 5310
SEM Analysis of Resin-Dentin Interface
The specimens were placed in aluminum stubs, covered with gold/palladium (Desk II—Denton Vacuum) and were examined in a scanning electron microscope (JMS 5310—Jeol).
SEM Analysis of Fractured Dental Beams
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