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Jms 5310

Manufactured by JEOL
Sourced in Japan

The JMS 5310 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials and samples. The JMS 5310 features a high-performance electron optical system and advanced imaging capabilities.

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2 protocols using jms 5310

1

SEM Analysis of Resin-Dentin Interface

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The polymerized resin discs after contact with bacterial culture and nisin particles were observed using SEM to analyze the presence of S. mutans. The fractured surface of the dentin sticks along the bonded interface was also observed using SEM in order to investigate the morphology and to study the mode of failure after microtensile bond strength.
The specimens were placed in aluminum stubs, covered with gold/palladium (Desk II—Denton Vacuum) and were examined in a scanning electron microscope (JMS 5310—Jeol).
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2

SEM Analysis of Fractured Dental Beams

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The dentine portion of representative fractured beams with adhesive fracture, and dentine slices obtained from initial sectioning of the teeth were used for SEM (JMS 5310; JEOL, Tokyo, Japan). Specimens were dehydrated, sputter-coated with gold/palladium, and examined at 15 kV. The images were used to clarify the classification of type of failure, for selection of the data to be included in the statistical analysis (see below).
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