Su8000 microscope

The second halves of the explanted IOLs were sent to the Max-Planck-Institute for Polymer Research in Mainz, Germany, for further analysis including scanning electron microscopy (SEM) and energy dispersive X-Ray spectroscopy (EDS). For SEM analysis 2.5 μm cross sections through the IOL material were acquired using an ultramicrotome (UCT, Leica, Germany) and a 35° diamond knife (Diatome, Switzerland) and mounted on silicium grids. SEM examinations were carried out in low voltage (<1 kV) conditions using an SU8000 microscope (Hitachi, Japan). For a local chemical analysis EDS was performed using a Quantax 400 EDS detector (Bruker, Germany) to detect exogenous chemical elements within the IOL material.
This study solely involves laboratory analyses of IOL explants. No additional procedures on humans or animals were performed. An informed consent and ethics committee approval were therefore not required.

SEM images were obtained on a field-emission Hitachi SU-8000 microscope. TEM images, elemental mappings and linear scanning were conducted on a JEM-2100F transmission electron microscope. Raman spectra were acquired on a high-resolution Raman spectrometer (HORIBA LabRAM HR800). Atomic force microscopy (AFM) images were obtained with Bruker Dimension Icon. The thickness of MPS NSs was acquired through analyzing AFM data with the software of Nano Scope Analysis (Bruker). The lateral sizes of MPS NSs were analyzed with the software of Nano Measure using TEM images.

PXRD measurements were conducted on a PANalytical B.V. Empyrean having Cu Ka radiation (1.540598 Å) under 40 kV and 40 mA. SEM images were gained on a HITACHI SU8000 microscope. High‐resolution TEM images were obtained on a JEOL JEM‐2200FS microscope. XPS tests were surveyed on an ESCALAB 250 spectrometer using Al Ka excitation. TGA test was conducted using a TA TGA Q500 thermal analyzer system at the heating rate of 5 °C min⁻¹ from room temperature to 800 °C in an air atmosphere.

All reagents except water used were commercial Sigma-Aldrich products. High-purity water with a resistivity of 18.2 MΩ·cm at 25 °C was prepared by a water purification system (CSR-1-30T).
Monodisperse polystyrene (PS) microspheres were synthesized by an emulsifier-free emulsion polymerization technique^{32 (link)}. Scanning electron microscopy (SEM) images were obtained using a Hitachi SU 8000 microscope operated at 15 kV. The average diameter of the PS microspheres was calculated from more than 100 microspheres. Polydispersity index (PDI) = D_m/D_n−1,where D_m and D_n were the weight-average and number-average diameters, respectively^{33 (link)}. The normal-incident reflectance spectra of 3D-PCswere obtained by using an Ocean Optics NIR Quest instrument equipped with a reflection probe. A specular reflectance standard(PN A338-MS-1) with a reflectance of 85–90% was used as measured reference.
An Nd:YAG laser was used as a laser source for LIDT test on continuous wave mode. The 1/e² spot diameters measured via the knife-edge method were 3 mm and the effective spot sizes were 7 mm².

Scanning electron microscopy was carried out using a Hitachi SU-8000 microscope operated at 5 kV. Transmission electron microscopy and high-angle annular dark-field scanning TEM (HAADF-STEM) observations were performed using a JEOL JEM-2100F operated at 200 kV equipped with an energy-dispersive spectrometry analyzer. The samples for TEM characterizations were prepared by depositing a drop of the diluted colloidal suspension on a grid. Wide-angle powder X-ray diffraction (XRD) patterns were acquired with a Rigaku Rint 2500 diffractometer with monochromated Cu-Kα radiation. Low-angle XRD patterns were obtained by using a NANO VIEWER (Rigaku, Japan) equipped with a Micro Max-007 HF high-intensity micro-focus rotating anode X-ray generator. X-Ray photoelectronic spectroscopy (XPS) spectra were obtained at room temperature by using a JPS-9010TR (JEOL) instrument with an Mg-Kα X-ray source. All the binding energies were calibrated via referencing to C 1s binding energy (284.6 eV).