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Jem 2100f

Manufactured by Shimadzu
Sourced in Japan

The JEM-2100F is a Transmission Electron Microscope (TEM) manufactured by Shimadzu. It is capable of high-resolution imaging and analysis of a wide range of materials at the nanoscale level. The JEM-2100F provides a stable and reliable platform for advanced research and development applications.

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2 protocols using jem 2100f

1

Comprehensive Material Characterization

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The morphologies of the samples were investigated by SEM (S4800, Japan), TEM (JEM-2100F, Japan), AFM (Veeco dimension V, USA), XRD (D8 Advance, Germany), UV-vis diffuse reflectance spectra (Shimadzu UV2550, Japan), XPS (Thermo ESCALAB 250, USA), inductively coupled plasma-atomic (ICP) mass spectrometry (Atomscan Advantage, Germany), superconducting quantum interference device (Quantum Design MPMS–XL, USA), X-ray absorption near-edge structure (Beamline of BL12B of Nation al Syncrotron Radiation Laboratory, China), Theoretical calculations (National Super Computing Centre in Jinan, China).
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2

Comprehensive Analysis of Adsorbent Morphology

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The morphology of adsorbents was examined using a scanning electron microscope (SEM, Shimadzu JEOL 7600F) and transmission electron microscope (TEM, Shimadzu JEOL JEM-2100F). The functional groups were characterized with an infrared spectrometer (IR, Thermo Nicolet NEXUS-470). The N2 adsorption–desorption isotherms were obtained using a surface area & pore size analyser (Micromeritics ASAP 2460). The zeta potentials of adsorbents at different pH levels were measured using a potentiometric analyzer (Zetasizer Nano ZS90).
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