Jsm 6510la electron

The P-XRD analysis employed Cu Ka radiation and was conducted using the X Pert PRO X-ray Diffraction instrument. The SEM and EDX studies were investigated using a JEOL JSM-6510LA electron microscope, while a JEOL Model JEM1400 instrument was used for the TEM study. The materials were synthesized using a HD150 PAD model Muffle Furnace, and the Autolab PGSTAT204 FRA32M was utilized to carry out CV and DPV studies. The Raman spectra were obtained from various locations of the sample using a Jobin Yvon LabRam HR spectrometer equipped with Ar laser 632 nm. XPS measurements were conducted via Omicron spectrometer with Al Ka as the X-ray source (1486.6 eV) to examine the atomic ratio of the elements and determine the corresponding elemental composition of the samples.

The synthesized CuO/Ag@n-hexene and CuO/Ag@lemon extract nanoporous composites were characterized by many analytical techniques. Powdered X-ray Diffraction (P-XRD) analysis was conducted using X Pert PRO X-ray diffraction with Cu Ka radiation. Morphological studies (SEM and EDX) was performed using JEOL JSM-6510LA electron microscope. The structural details, size distribution, and morphology of nanoparticles were conducted by TEM analysis using JEM1400 instrument. The Muffle Furnace, MODEL: HD150 PAD was employed for the synthesis of all nanoporous materials. Electroanalytical (CV DPV and amperometry) studies were performed using Autolab PGSTAT204 FRA32M.