Nova nanosem field emission scanning electron microscope
The NOVA nanoSEM is a field emission scanning electron microscope designed for high-resolution imaging and analysis of a wide range of materials and samples. It features a stable electron beam, advanced optics, and a range of detection modes to capture detailed topographical and compositional information about the sample.
Lab products found in correlation
4 protocols using nova nanosem field emission scanning electron microscope
Scanning Electron Microscopy of Microcages
Characterizing ASD Particle Morphology
of ASD particles and ASD films (prepared by the spin-coating method
as described above) before and after incubation in acidic media was
examined by a Nova nanoSEM field emission scanning electron microscope
(FEI Company, Hillsboro, OR). Samples were mounted on an aluminum
stub using double-sided sticky carbon tape and coated with a thin
film of platinum using a sputter coater (Cressington Sputter Coater,
Watford, UK) for 60 s. SEM images were obtained using an Everhart–Thornley
detector with a spot size of 3 nm, beam energy of 5 kV, and working
distance of approximately 5 mm.
Microscopic Characterization of Bacterial Morphology
For transmission electron microscopy (TEM), samples of late logarithmic/early stationary phase cells grown at 4°C were fixed in 2.5% glutaraldehyde in 0.1 M sodium cacodylate buffer, post-fixed in buffered 1% osmium tetroxide containing 0.8% potassium ferricyanide, and stained in 1% aqueous uranyl acetate. The samples were then dehydrated with a graded series of acetonitrile and embedded in EMbed-812 resin. Thin sections (80 nm) were stained with 2% uranyl acetate and lead citrate and imaged using an FEI/Philips CM-10 transmission electron microscope (FEI Company, Hillsboro, Oregon, United States). Samples for scanning electron microscopy (SEM) were fixed in buffered 2.5% glutaraldehyde, post-fixed in 1% osmium tetroxide, dehydrated in a graded ethanol series, and critical-point dried. Specimens were then platinum-coated and cryosamples imaged using an FEI NOVA nanoSEM field emission scanning electron microscope.
Detailed Nanoparticle Characterization Protocol
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