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Quantax 400 eds detector

Manufactured by Bruker
Sourced in Germany

The Quantax 400 EDS detector is a high-performance energy-dispersive X-ray spectroscopy (EDS) system designed for elemental analysis in scanning electron microscopes. It features a Silicon Drift Detector (SDD) with a large active area and efficient energy resolution, enabling accurate and reliable elemental identification and quantification.

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2 protocols using quantax 400 eds detector

1

Detailed Analysis of Explanted IOLs

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The second halves of the explanted IOLs were sent to the Max-Planck-Institute for Polymer Research in Mainz, Germany, for further analysis including scanning electron microscopy (SEM) and energy dispersive X-Ray spectroscopy (EDS). For SEM analysis 2.5 μm cross sections through the IOL material were acquired using an ultramicrotome (UCT, Leica, Germany) and a 35° diamond knife (Diatome, Switzerland) and mounted on silicium grids. SEM examinations were carried out in low voltage (<1 kV) conditions using an SU8000 microscope (Hitachi, Japan). For a local chemical analysis EDS was performed using a Quantax 400 EDS detector (Bruker, Germany) to detect exogenous chemical elements within the IOL material.
This study solely involves laboratory analyses of IOL explants. No additional procedures on humans or animals were performed. An informed consent and ethics committee approval were therefore not required.
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2

Scanning Electron Microscopy of Explanted Electrodes

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All of the electrodes were carefully removed from the patients, without any complications or damage to the hardware. The electrodes were preserved in three different surgical specimen boxes after rinsing them with saline solution. The study included both the explanted electrodes (3389; Medtronic, length 25 cm) and a new lead produced by the same company (3389; Medtronic, length 40 cm). Depending on the facilities availability, the analysis through SEM-EDX techniques was not performed the same day of removal.
Scanning electron microscopy characterization of the electrode had been performed at the Micro and Nano-Fabrication Platform of Fondazione Filarete, Milan, Italy, using a Zeiss Sigma Field Emission Scanning Electron Microscope (FE-SEM). The chemical composition analysis of the samples was performed using a Bruker Quantax 400 EDS detector (30 mm 2 XFlash silicon drift detector) installed on the SEM.
SEM was carried out to describe the morphological features of the electrodes at different magnifications, while EDX was performed to analyze the chemical properties of the materials.
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