The prepared Ag-NPs were characterized using X-ray diffraction (XRD), ultraviolet–visible spectroscopy, transmission electron microscopy (TEM), scanning electron microscopy (SEM), energy dispersive X-ray (EDX) spectroscopy and Fourier transform infrared (FT-IR). The XRD patterns were recorded at a scan speed of 2° min−1. Meanwhile, the structures of the produced Ag-NPs were examined using Shimadzu PXRD-6000, powder x-ray diffraction. Moreover, TEM observations were carried out using the Hitachi H-7100 electron microscopy, whereas the particle size distributions were determined using the UTHSCSA Image Tool software (Version 3.00). To ensure the formation of Ag-NPs, the colloids solutions were tested for their optical absorption property using a Shimadzu H.UV, 1650 PC UV-visible spectrophotometer over the range of 300 to 700 nm. Furthermore, SEM and EDX were performed utilizing the XL 30 Philips instrument to study the morphology of [Ag (GSH)]. Moreover, the FT-IR spectra were recorded over the range of 200–4000 cm−1 utilizing the Series 100 PerkinElmer FT-IR 1650 spectrophotometer. After the reactions, the samples were centrifuged by using a high-speed centrifuge machine (Avanti J25, Beckman).
Pxrd 6000
Manufactured by Shimadzu
Sourced in Japan
The PXRD-6000 is a powder X-ray diffractometer designed for phase identification and quantification of crystalline materials. It utilizes Cu-Kα radiation to generate diffraction patterns that can be analyzed to determine the crystalline structure and composition of samples. The instrument is capable of performing a range of XRD measurements, including qualitative and quantitative analysis, as well as in-situ studies.
Automatically generated - may contain errors
3 protocols using pxrd 6000
1
Comprehensive Characterization of Silver Nanoparticles
2
Characterization of Silver Nanoparticles
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The FTIR spectrum was recorded in
the range between 4000 and 400
cm–1 using a Bruker Optik GmbH; model no., TENSOR
27; Software, OPUS version 6.5.23 (link) The X-ray
diffraction (XRD) pattern was measured using a powder X-ray diffractometer
(PXRD-6000 Shimadzu) at angle 2θ and a scan axis of 2:1 sym.
The formation of AgNPswas confirmed from the PXRD peak positions using
Bragg’s law.39 (link) The morphology of
the AgNPs was examined using field emission scanning electron microscopy
(Hitachi SU6600) on a carbon-coated copper grid equipped with an EDAX
attachment. The size and the morphology of the AgNPs were examined
using atomic force microscopy (AFM, diCP II Veecs) and transmission
electron microscopy (TEM). For measuring AgNPs using TEM, the freeze-dried
AgNPs were placed on the carbon-coated copper grids and kept overnight
in a vacuum desiccator before loading them onto a specimen holder.
TEM micrographs of the AgNPs were obtained using a JEOL (JSM 100 cx)
TEM instrument operated at an accelerating voltage of 200 kV.
the range between 4000 and 400
cm–1 using a Bruker Optik GmbH; model no., TENSOR
27; Software, OPUS version 6.5.23 (link) The X-ray
diffraction (XRD) pattern was measured using a powder X-ray diffractometer
(PXRD-6000 Shimadzu) at angle 2θ and a scan axis of 2:1 sym.
The formation of AgNPswas confirmed from the PXRD peak positions using
Bragg’s law.39 (link) The morphology of
the AgNPs was examined using field emission scanning electron microscopy
(Hitachi SU6600) on a carbon-coated copper grid equipped with an EDAX
attachment. The size and the morphology of the AgNPs were examined
using atomic force microscopy (AFM, diCP II Veecs) and transmission
electron microscopy (TEM). For measuring AgNPs using TEM, the freeze-dried
AgNPs were placed on the carbon-coated copper grids and kept overnight
in a vacuum desiccator before loading them onto a specimen holder.
TEM micrographs of the AgNPs were obtained using a JEOL (JSM 100 cx)
TEM instrument operated at an accelerating voltage of 200 kV.
3
Physicochemical Analysis of Solid Lipid Nanocarriers
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A qualitative PXRD analysis was performed to examine the physical state of RP in pure RP powder, pure solid lipid, physical mixture of Dynasan ® 114 lipid and RP, and freezedried formulated RP-SLN and RP-NLC using a powder X-ray diffractometer (PXRD 6000, Shimadzu, Japan). In this technique, the samples were exposed to nickel filtered CuKα radiation (40 kV, 30 mA) and scanned from 2° to 50°, 2θ at a step size of 0.045° and step time of 0. 5 s.
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