Fourier transform infrared spectrophotometer ft ir 8300

Chemicals were purchased from Merck Chemical Company. NMR spectra were recorded on a Bruker Avance DPX-400 and 300 using deuterated CDCl₃ and DMSO-d₆ as solvent and TMS as internal standard. The purity of the products and the progress of the reactions were accomplished by TLC on silica-gel polygram SILG/UV254 plates. TEM analysis was performed using TEM microscope (Philips EM 208S). EDS mapping were found using a TSCAN MIRA3. FT-IR spectra were recorded on a Shimadzu Fourier Transform Infrared Spectrophotometer (FT-IR-8300). Thermal gravimetric analysis (TGA) was performed using a Shimadzu thermos-gravimetric analyzer (TG-50). X-ray diffraction (XRD) was done on a Bruker D8-advance X-ray diffractometer with Cu K_α (λ = 0.154 nm) radiation. XPS analyses were performed using a VG-Microtech Multilab 3000 spectrometer, equipped with an Al anode. The deconvolution of spectra was carried out by using Gaussian–Lorentzian curves. The Pd and Co content on the catalyst was determined by OPTIMA 7300DV ICP analyzer. Qualitative elemental analysis was determined and analyzed by CHNO elemental analyzer (Thermo Finnigan, FLASH EA 1112 series, Italy).

All Chemicals and solvents were bought from Merck Chemical Company. The product purity and the reaction progress were investigated by TLC using silica gel polygram SILG/UV254 plates. The Fourier transform infrared (FT-IR) spectra were recorded on a Shimadzu Fourier Transform Infrared Spectrophotometer (FT-IR-8300). X-ray photoelectron spectroscopy (XPS) analyses were accomplished using a VG-Microtech Multilab 3000 spectrometer, equipped with an Al anode. The deconvolution of spectra was performed by using Gaussian Lorentzian curves. The content of W in the catalyst was determined by OPTIMA 5300DV ICP analyzer. The transmission electron microscopy (TEM) analysis was performed using Philips EM208S operating at 100 kV. FESEM were achieved using a TESCAN MIRA3. Thermo-gravimetric analysis (TGA) was carried out using TA-Q600. The vibrating sample magnetometer (VSM) analysis was performed using Lake Shore Cryotronics 7407. X-ray diffraction (XRD) analysis was performed using XRD Philips PW1730. Melting points were measured by an electrothermal 9100 apparatus.