UV–vis absorption spectra were recorded with a Shimadzu 3600 UV–vis near-infrared spectrophotometer. PL measurements were performed with a Shimadzu RF-5301 PC spectrofluorimeter. The excitation wavelength was 350 nm with a 3/3 nm slit. PL decay results were measured by an Edinburgh FLS 920 spectrofluorimeter or Femtosecond Laser as excitation resource and oscilloscope as signal receiver. All optical measurements were performed at room temperature under ambient conditions. TEM images were recorded by a Tecnai F20 electron microscope with an acceleration voltage of 200 kV. XRD result was carried out by using the D/max-2500/PC. ICP results were measured by a PE5300DV ICP equipment. Purified QDs powder was used in ICP and XRD measurements. QD powder was obtained by precipitating QD from solution with equal volume of isopropanol and followed by drying in vacuum. We utilized a commercial Ti:sapphire regenerative amplifier (Libra, Coherent) at 800 nm (1.55 eV) with a repetition rate of 1 kHz and pulse duration of ~90 fs to carry out the TA experiments. For broadband measurements, a second-harmonic light source at 3.1 eV was used as the pump beam and an optical parametric amplifier (OperA solo, Coherent) was used to provide a probe beam with tunable wavelength. The relative polarizations of the pump and probe beams were set to be at the magic angle (54.7°).
Fls920 spectrofluorimeter
Manufactured by Edinburgh Instruments
Sourced in United Kingdom
The FLS920 spectrofluorimeter is a high-performance laboratory instrument designed for the measurement of fluorescence and phosphorescence spectra. It features a stable xenon arc lamp as the excitation source and a double monochromator system for precise wavelength selection. The FLS920 can accurately measure emission and excitation spectra, as well as fluorescence lifetimes and quantum yields.
Automatically generated - may contain errors
Lab products found in correlation
Rf 5301 pc spectrofluorimeter, by Shimadzu (1 mentions)
3600 uv vis near infrared spectrophotometer, by Shimadzu (1 mentions)
D8 advance, by Bruker (1 mentions)
Lambda 16 uv vis spectrometer, by PerkinElmer (1 mentions)
Epl 445, by Edinburgh Instruments (1 mentions)
Lambda 950 uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
2400 elemental analyzer, by PerkinElmer (1 mentions)
D max 2550 x ray powder diffractometer, by Rigaku (1 mentions)
7 protocols using fls920 spectrofluorimeter
1
Characterization of Quantum Dot Properties
2
Thin Film Characterization: Optical, Structural, and Topographical Analysis
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UV-vis absorption and photoluminescence (PL) spectra of thin films were recorded on a HP 8453 spectrophotometer and FLS920 spectrofluorimeter (Edinburgh Instruments), respectively. A 150 W, ozone-free xenon arc lamp was used in PL measurements. Scanning electron microscope (SEM) images were obtained by using a field emission scanning electron microscope (JEOL-7401). Thicknesses of thin films were measured by Dektak 150 surface profilometer. X-Ray Diffraction (XRD) patterns were measured by an X-ray diffractometer Bruker D8 Advance using Cu Kα radiation source with a scan rate of 10° min−1.
3
Optical Characterization of Washed Nanocrystals
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Samples for optical measurements were prepared by diluting the stock solution of washed NCs with anhydrous toluene under nitrogen and stored in sealed quartz cuvettes. Absorption spectra were measured on a double-beam PerkinElmer Lambda 16 UV/vis spectrometer. Photoluminescence and PL excitation spectra were recorded on an Edinburgh Instruments FLS920 spectrofluorimeter equipped with a 450 W xenon lamp as excitation source and double grating monochromators. PL decay curves were obtained by time-correlated single-photon counting on a liquid nitrogen cooled Hamamatsu R5509-72 photomultiplier tube. A pulsed diode laser (EPL-445 Edinburgh Instruments, 441 nm, 55 ps pulse width, 0.2 MHz repetition rate) was used as the excitation source.
4
Fluorescent Spectra Characterization
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The emission and excitation spectra were recorded at 295 K using an Edinburgh FLS-920 spectrofluorimeter in water or ethanol suspension (C = 500 µg.mL 1 ) or for powdered samples.
The excitation source was a 450 W Xe arc lamp. The emission spectra were corrected for detection and optical spectral response of the spectrofluorometer.
The excitation source was a 450 W Xe arc lamp. The emission spectra were corrected for detection and optical spectral response of the spectrofluorometer.
5
Optical Characterization of Semiconductor Nanocrystals
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Absorption
spectra were recorded
with a PerkinElmer lambda 950 UV–vis/NIR spectrophotometer.
PL measurements were performed with an Edinburgh Instruments FLS920
spectrofluorimeter equipped with a 450 W Xe lamp, a double excitation
monochromator, and emission monochromator. The signal was detected
with a Hamamatsu R928 PMT detector or, when the emission was at 800
nm or longer, with an Acton research SpectraPro 300i CCD camera with
optical fiber. The magnitude of the shift of the peak positions in
the optical spectra was calculated by converting the spectra to eV
scale, according to the method reported by Ejder et al.44 (link) and comparing the peak positions of the product
NCs to the peak position of the seed CIS NCs. The peak position of
the absorption spectra was determined by taking the second derivative
of the spectra.
spectra were recorded
with a PerkinElmer lambda 950 UV–vis/NIR spectrophotometer.
PL measurements were performed with an Edinburgh Instruments FLS920
spectrofluorimeter equipped with a 450 W Xe lamp, a double excitation
monochromator, and emission monochromator. The signal was detected
with a Hamamatsu R928 PMT detector or, when the emission was at 800
nm or longer, with an Acton research SpectraPro 300i CCD camera with
optical fiber. The magnitude of the shift of the peak positions in
the optical spectra was calculated by converting the spectra to eV
scale, according to the method reported by Ejder et al.44 (link) and comparing the peak positions of the product
NCs to the peak position of the seed CIS NCs. The peak position of
the absorption spectra was determined by taking the second derivative
of the spectra.
6
Quantifying BPEI Concentration via Fluorescamine
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Standard BPEI solutions of concentration 0.05, 0.1, 0.25, 0.5 and 1 g/L were prepared in water. 100 µL of each BPEI solution was added to 2.9 mL of a 0.05 M sodium tetraborate buffer solution at pH 9. Then, 1 mL of 0.3 g/L fluorescamine in acetone solution was added to the buffered BPEI solution and the mixture was allowed to react for 12 h in the dark. Finally, fluorescence measurements of the solutions were performed using a FLS920 spectrofluorimeter (Edinburgh Instruments, Livingston, UK). The fluorescence intensities at the maximum emission of 472 nm (excitation at 388 nm) were extracted and used to plot a concentration calibration curve for BPEI. Then titration of BPEI in supernatants resulting from LN@BPEI centrifugation at each of the 6 washing steps was achieved, analyzing 100 µL of the supernatant after each washing step with the procedure detailed above.
7
Multimodal Characterization of Functional Materials
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All reagents and solvents used were obtained from commercially available sources without further purification. Elemental analyses were performed on a Perkin-Elmer 2400 elemental analyzer. IR spectra were recorded within the 400–4000 cm−1 region on a Nicolet Impact 410 FTIR spectrometer using KBr pellets. Thermogravimetric experiments were performed with a TGA Q500 V20.10 Build 36 from room temperature to 800 °C at a heating rate of 10 °C min−1. X-ray photoelectron spectroscopy (XPS) data were collected on an ESCALAB 250 X-ray photo electron spectroscopy, using Mg Kα X-ray as the excitation source. X-ray powder diffraction (XRPD) patterns were taken on a Rigaku D/max 2550 X-ray powder diffractometer, with a speed of 1° min−1. The luminescence spectra were recorded on an Edinburgh Instruments FLS920 spectrofluorimeter from room temperature down to 6 K at a decreasing rate of 5 K min−1 (scan slit, 1.00 nm; fixed/offset slit, 1.00 nm; lamp, Xe900; step, 4.00 nm).
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