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Fast scan afm instrument

Manufactured by Bruker

The Fast Scan AFM instrument is a scanning probe microscopy system developed by Bruker. It is designed to provide high-speed, high-resolution imaging capabilities for various samples. The core function of the Fast Scan AFM is to enable rapid scanning and capture of topographical and other surface-related data with nanometer-scale resolution.

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3 protocols using fast scan afm instrument

1

AFM Imaging of Oligomer and hIAPP Samples

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A volume of 5 μL sample solution via different times of incubation was deposited onto a freshly cleaved mica surface for 15 minutes. Then, the sample on mica was washed twice with either Milli-Q water (for all oligomer samples) or phosphate buffer (for all hIAPP samples) and baked for 5 minutes at 65 °C in an oven to flat the lipid film. Atomic force microscopy (AFM) measurements were performed at room temperature on a Fast Scan AFM instrument (Bruker Instruments Inc., German) using tapping mode. Images were collected at a scan rate of 1 Hz and a scan angle of 0°.
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2

Nanoscale Peptide Imaging on Graphite

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All peptides were purchased from Genscript (http://www.genscript.com/) at >98% purity (HPLC purified), and all buffers were prepared in ultrapure deionized water (Millipore, Billerica, MA). For pH study, a tricomponent buffer composed of citrate, HEPES, and CHES was used (broad-range buffer CHC; Molecular Dimensions, Altamonte Springs, FL). Highly oriented pyrolytic graphite (HOPG) slabs for imaging on graphite were purchased from SPI Supplies (Structure Probe, West Chester, PA). Atomic force microscopy (AFM) imaging was performed with a FastScan AFM instrument (Bruker Instruments, Billerica, MA) using soft triangular-shaped silicon nitride cantilevers (FastScan C, Bruker Instruments) characterized by a nominal spring constant of k ∼ 0.8 N/m and a nominal resonant frequency of 300 kHz. Imaging was performed using the FastScan device’s ScanAsyst Mode at speeds of ∼4 lines/s for optimal topographic quality. For AFM imaging under fluid, we used a home-made perfusion cell that allowed the fluid medium to be refreshed.
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3

Comprehensive Characterization of MXene

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The electrical and synaptic performance is characterized by the semiconductor parameter analyzer (Keysight B2902A and Keysight 4200-SCS). The AFM (Nanoscope III, Veeco Instruments, Inc.) is used to measure the mixing films morphology under ambient conditions. UV−vis absorption spectra is recorded to characterize ultraviolet-visible-near infrared spectrophotometer (Shimadzu UV-3600 Plus). The SEM images of MXene are obtained on a focusion beam/SEM (Nova NanoSEM 230). KPFM measurements are performed in ambient air using a Bruker Fastscan AFM instrument.
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