Fast scan afm instrument
The Fast Scan AFM instrument is a scanning probe microscopy system developed by Bruker. It is designed to provide high-speed, high-resolution imaging capabilities for various samples. The core function of the Fast Scan AFM is to enable rapid scanning and capture of topographical and other surface-related data with nanometer-scale resolution.
3 protocols using fast scan afm instrument
AFM Imaging of Oligomer and hIAPP Samples
Nanoscale Peptide Imaging on Graphite
Comprehensive Characterization of MXene
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