Ultra55 field emission scanning electron microscopy
The Ultra55 field emission scanning electron microscope (FE-SEM) is a high-resolution imaging tool designed by Zeiss. It provides detailed, magnified views of small-scale samples by utilizing a focused electron beam to scan the surface of the specimen. The Ultra55 FE-SEM enables the observation and analysis of a wide range of materials at the nanoscale level.
2 protocols using ultra55 field emission scanning electron microscopy
Concrete Microbar Morphology Analysis
Analytical Techniques for Membrane Synthesis
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