The following equipment were used for the research: FEI Nova NanoSEM 230 microscope (FEI Company, Hillsboro, Oregon, USA), x-ray powder diffractometer (XRD) (PANalytical, The Netherlands), energy-dispersive x-ray fluorescence spectrometer (EDXRF) XDV-SD model (Helmut Fischer GmbH, Sindelfingen, Germany), energy-dispersive x-ray fluorescence spectrometer (EDXRF) Epsilon 3 model (PANalytical, Almelo, The Netherlands), and inductively coupled plasma optical emission spectrometer (ICP-OES) SpectroBlue FMS16a model (Spectro Analytical Instruments GmbH, Germany). The apparatus is described in detail in
Fei nova nanosem 230 microscope
The FEI Nova NanoSEM 230 is a field emission scanning electron microscope (FESEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness field emission electron source, advanced electron optics, and a versatile specimen chamber to enable detailed characterization of samples at the nanoscale level.
2 protocols using fei nova nanosem 230 microscope
Synthesis and Characterization of Selenium-doped Titanium Oxide Nanocomposites
The following equipment were used for the research: FEI Nova NanoSEM 230 microscope (FEI Company, Hillsboro, Oregon, USA), x-ray powder diffractometer (XRD) (PANalytical, The Netherlands), energy-dispersive x-ray fluorescence spectrometer (EDXRF) XDV-SD model (Helmut Fischer GmbH, Sindelfingen, Germany), energy-dispersive x-ray fluorescence spectrometer (EDXRF) Epsilon 3 model (PANalytical, Almelo, The Netherlands), and inductively coupled plasma optical emission spectrometer (ICP-OES) SpectroBlue FMS16a model (Spectro Analytical Instruments GmbH, Germany). The apparatus is described in detail in
Textural and Morphological Characterization of Samples
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