Contour gt k1 optical profiler

A non-contact optical profilometer (Contour Gt-K1 optical profiler; Bruker Nano, Inc., Tucson, AZ, USA) was utilized to assess the surface roughness values (Ra and Rz) of all specimens. The evaluation involved mounting each specimen on an automated x-y stage and scanning three random scanning points using the previously prescribed method [36 (link)]. Afterwards, the capture images underwent analysis to derive the Ra and Rz values of each specimen, and the results were expressed in micrometers (µm) [27 (link)].
Prior to SEM evaluation, a single random specimen was selected from each group and was coated with gold using an ion sputter coater (G20, GSEM, Suwon, Republic of Korea). The SEM analysis was conducted using a CUBE-II tabletop machine (EmCrafts Co., Gwangju-si, Republic of Korea) at an accelerating voltage of 10 kV with a secondary electron detector. The micrographs of the HP, AS, and ND groups were captured and analyzed under different magnifications (×100, ×250, ×500, and ×1000) to assess the surface characteristics of the ADB materials. A representative micrograph from all groups was displayed at a magnification of ×1000.

A non-contact optical interferometric profilometer (Contour Gt-K1 optical profiler; Bruker Nano, Inc., Tucson, AZ) was used to measure the Ra of the specimens at a 0.01 mm resolution. The specimens (approximate area 0.43×0.58 mm) were scanned with a standard camera at 20× at five sites, and the average for each specimen was calculated. A software package (Vision64, Bruker Nano) was used to analyze the acquired images. Pit characteristics were determined, and the Ra value of each specimen was calculated.

A noncontact optical interferometric profilometer (Contour Gt-K1 optical profiler; Bruker Nano, Inc., Tucson, AZ) was used to record the surface roughness (R_a) of the specimens. Each specimen was evaluated at three locations, and the values were averaged to get the final specimen roughness value in μm.