Quanta 450 environmental scanning electron microscope
The Quanta 450 Environmental Scanning Electron Microscope (ESEM) is a high-performance electron microscope designed for a wide range of sample analysis applications. It provides high-resolution imaging capabilities and the ability to observe samples in their natural state without the need for extensive sample preparation.
Lab products found in correlation
3 protocols using quanta 450 environmental scanning electron microscope
Comprehensive Materials Characterization
Stereomicroscopic Examination and Imaging of Arachnid Genitalia
All specimens treated here are deposited in the
Scanning Electron Microscopy of ZnO-Treated Leaves
2 mm × 2 mm
region of the abaxial- and adaxial-dosed leaves were cut by a razor
blade and placed on SEM grids. After cutting, the leaf samples were
immediately coated with Pt before being analyzed by an FEI Quanta
450 Environmental Scanning Electron Microscope on the same day. The
analysis was done under high vacuum mode, 500–5000 × magnification,
accelerating voltage of 10, 000 kV. The detector used was an Everhart–Thornley
detector for all leaf samples except the control leaf, where a concentric
back scattered detector was used.
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