X celerator

Manufactured by Malvern Panalytical

Sourced in United Kingdom

The X'Celerator is a high-speed X-ray diffraction (XRD) detector produced by Malvern Panalytical. It is designed to rapidly collect X-ray diffraction data, improving the efficiency and throughput of XRD analysis.

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Lab products found in correlation

X pert pro diffractometer, by Malvern Panalytical (2 mentions) Sigma 300, by Zeiss (2 mentions) X pert pro, by Malvern Panalytical (2 mentions) X pert pro x ray diffractometer, by Malvern Panalytical (1 mentions) Dmc 4500, by Leica (1 mentions) Xflash 6, by Zeiss (1 mentions) X pert pro xrd, by Malvern Panalytical (1 mentions) X pert highscore plus software, by Malvern Panalytical (1 mentions) X pert3 powder x ray diffractometer, by Malvern Panalytical (1 mentions)

7 protocols using x celerator

X-ray Diffraction Analysis of Materials

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A PANalytical X’Pert PRO X-ray
diffractometer mounted in the Bragg–Brentano configuration
with a Cu anode (0.4 mm × 12 mm line focus, 45 kV, 40 mA) and
a real-time multistrip (RTMS) detector (X’Celerator) was used
for the collection of X-ray diffraction patterns at room temperature.
The samples were measured inside a sealed sample holder, with a Kapton
foil cover, maintaining the dry argon atmosphere of the glovebox.
A typical diffractogram was obtained in about 8 h, by step scanning
in the angle range 10° ≤ 2θ ≤ 120° with
a step size of 0.008° (2θ). The Rietveld method as implemented
in the FullProf suite^{30 (link)} was used for the
structural analysis.

Smith A.L., de Zoete N., Rutten M., van Eijck L., Griveau J.C, & Colineau E. (2020). Report of the Double-Molybdate Phase Cs2Ba(MoO4)2 with a Palmierite Structure and Its Thermodynamic Characterization. Inorganic Chemistry, 59(18), 13162-13173.

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Comprehensive Characterization of Tanghulu

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The optical photograph of “Tanghulu” was obtained by a metallurgical microscope (Leica Dmc4500). Powder XRD measurements were performed using X′ Pert PRO diffractometer (PANalytical) equipped with X’ Celerator RTMS detector and using copper X-ray tube (standard) radiation at 40 kV and 40 mA voltage. The morphology and element distribution of the products were checked by a field emission scanning electron microscope (FESEM) (Zeiss Sigma 300) equipped with an EDS system (XFlash6). The microstructure of main structure micro-rod of “Tanghulu” was revealed by transmission electron microscope (TEM) and the high resolution TEM (HRTEM) images (Titan G260-300). The Raman spectrum was obtained by RENISHAW Ren Cam spectrum equipped with 488 nm laser. The hardness of the BP micro-rod, or the main structure of “Tanghulu”, is measured by a nano-indenter (Tl-950, Bruker).

Liang Y., Lu X., Ding Y, & Zheng W. (2021). Super-hard “Tanghulu”: cubic BP microwire covered with amorphous SiO2 balls. Heliyon, 7(11), e08300.

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Analysis of exTTF-fiber structure

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X-ray diffraction was performed in a Panalytical X’Pert PRO diffractometer with Cu tube (lambda Kα = 1.54187 Å) operated at 45 kV, 40 mA, Ni beta filter, programmable divergence and anti-scatter slits working in fixed mode, and fast linear detector (X’Celerator) working in scanning mode. In the case of exTTF-fibers (1), the PXRD measurements were obtained from a dispersion of 1, which was prepared by dropping over toluene an initial solution of 1 in TCE. This dispersión was drop-casted over a silica support and air dried at room temperature for 24 h.

Insuasty A., Atienza C., Luis López J., Marco-Martínez J., Casado S., Saha A., Guldi D.M, & Martín N. (2015). Supramolecular One-Dimensional n/p-Nanofibers. Scientific Reports, 5, 14154.

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X-Ray Powder Diffraction Analysis

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XRD powder patterns were recorded by an X’Pert Pro, Panalytical spectrometer equipped with a X’Celerator RTMS detector using Cu Kα radiation (λ = 0.154 nm) and a 2θ angle ranging from 5 to 80°.

Cisneros S., Abdel-Mageed A., Mosrati J., Bartling S., Rockstroh N., Atia H., Abed H., Rabeah J, & Brückner A. (2022). Oxygen vacancies in Ru/TiO2 - drivers of low-temperature CO2 methanation assessed by multimodal operando spectroscopy. iScience, 25(3), 103886.

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XRD Analysis of NiTi Instruments

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XRD was done to evaluate the inner composition of internal phases. New and after SCU instruments of OShape (n=2) and OCurve (n=2) were sectioned in 2 transversal portions. These sections were embedded at a room temperature setting epoxy resin and ground under constant water flow with progressively finer abrasive papers (#P320 to #P2500 grit size) until complete exposure of the axial cross section of the NiTi instruments. Final polishing was obtained with a polycrystalline diamond paste (3 μm) and a silica paste (50 nm). XRD (XRD–X’Pert Pro, PANAlytical, Almelo, Netherlands) was performed in order to provide data concerning crystallographic features and phase composition of the instruments. XRD was performed at room temperature (≈25°C) with Cu-Kα monochromatic radiation generated by an X-ray tube set at 40 kV and 40 mA. The range for the acquisition was 30°<2θ<100° with a step size of 0.017° and acquisition time of 1100 s/step, using a 1D-array of solid state detectors (X’Celerator, PANAlytical). XRD patterns were analysed using the X’Pert Highscore Plus software for phase identification (PANAlytical) (18 (link), 19 (link)).

Azizi A., Prati C., Schiavon R., Fitzgibbon R., Pirani C., Iacono F., Pelliccioni G.A., Spinelli A., Zamparini F., Puddu P., Bolelli G, & Generali L. (2021). In-Depth Metallurgical and Microstructural Analysis of Oneshape and Heat Treated Onecurve Instruments. European Endodontic Journal, 6(1), 90-97.

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Crystallinity Analysis of PALNs

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The crystallinity of PALNs synthesised was studied through the sharpness of peak in the XRD spectra by X’Pert³ Powder X-Ray Diffractometer with X’Celerator (Malvern Panalytical, UK). Samples used were lyophilised PALNs, pure ACV, and PM. Samples were radiated with CuK α radiation at 45 kV and 140 mA. 2θ scan range from 0° to 60°, with 3°/min scanning rate, and 0.05° step size were set (17 (link)). All the tests were performed in triplicates.

Mahmood S., Kiong K.C., Tham C.S., Chien T.C., Hilles A.R, & Venugopal J.R. (2020). PEGylated Lipid Polymeric Nanoparticle–Encapsulated Acyclovir for In Vitro Controlled Release and Ex Vivo Gut Sac Permeation. AAPS PharmSciTech, 21(7), 285.

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Powder X-Ray Diffraction Analysis of Drug-Polymer Microparticles

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Powder X-ray diffraction (XRD) patterns of the pure drug, pure polymer and microparticles were obtained using an X’Pert Pro X-ray diffractometer equipped with an X’Celerator detector (Malvern Panalytical Ltd., Worcestershire, UK). Diffraction data were acquired by exposing powder samples to Cu-Kα X-ray radiation (1.5418 Å) using 45 kV voltage and a current of 40 mA. Samples were loaded on a silicon zero-background holder and scanned from 3 to 40° 2Theta. The total scanning time was 0.5 h per sample (with a step size of 0.017° 2Theta and a scan step time of 100 s).

Jurić Simčić A., Erak I., Cetina Čižmek B., Hafner A, & Filipović-Grčić J. (2023). Selection of Excipients for the Preparation of Vancomycin-Loaded Poly(D,L-lactide-co-glycolide) Microparticles with Extended Release by Emulsion Spray Drying. Pharmaceutics, 15(10), 2438.

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