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Evo 15 microscope

Manufactured by Zeiss

The EVO 15 is a high-performance scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide detailed, high-resolution images of a wide range of samples. The EVO 15 utilizes an electron beam to scan the surface of a sample, generating images that reveal the sample's topography and composition. This microscope is suitable for various applications, including materials science, nanotechnology, and life sciences research.

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2 protocols using evo 15 microscope

1

Thermal and Morphological Analysis of rLLDPE and sLLDPE

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The chemical structure of the rLLDPE and sLLDPE was confirmed by using the Fourier transform infrared spectrophotometer (FTIR). The Vertex 70 FTIR spectrometer was equipped with HYPERION™ series microscope (Bruker Optik GmbH, Ettlingen, Germany). The thermal DSC analysis (Perkin Elmer DSC 4000) was programmed to include a heating zone between 30 and 350°C at a heating rate of 10°C/min, and Nitrogen was used as the purging gas. The surface morphology and elemental analysis were analyzed by SEM–EDX mapping (ZEISS EVO 15 microscope). The sponge surfaces were pre-coated with a thin gold layer in order to reduce charging in the SEM.
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2

Microplastics Identification and Analysis

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The identification of microplastics was confirmed through DSC measurements using a PerkinElmer DSC 4000 instrument. Each extracted substance, weighing 3.0 mg, was analyzed in an aluminum crucible under a nitrogen atmosphere with a temperature range of 30–350 °C and a heating rate of 10 °C per minute. The surface morphology of the Ir-(rLLDPE) sponges was examined using a ZEISS EVO 15 microscope, and the elemental distribution was investigated through coupled SEM/EDX mapping analysis using a BRUKER Nano GmbH 410-M instrument.
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