Spectrum two infrared spectrometer

Samples of OL, beta-CD, HP-beta-CD, physical mixtures of the host molecule and guest molecule, beta-CD:OL and HP-beta-CD:OL were prepared according to the complex formula. FT-IR spectra were scanned in the range of 400–4000 cm⁻¹ [11 (link)], respectively, by an FT-IR spectrometer (Spectrum Two Infrared Spectrometer, Perkin Elmer, Shanghai, China). Before the scan, the samples were compressed into thin tablets with KBr, respectively.

Transmission electron microscopy (TEM) images were observed under a JEOL-2010 electron microscope (JEOL, Tokyo, Japan) operating at 200 kV. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) was performed on a JSM-7800F field-emission scanning electron microscope (JEOL, Tokyo, Japan) with an X-Max50 energy spectrometer (Oxford Instruments, Oxford, UK). Nanoparticle size and zeta potential were determined using a Malvern Zetasizer 3000HSA instrument (Malvern Instruments, Malvern, UK). Fourier transform infrared spectra (FT-IR) were obtained on a spectrum two infrared spectrometer (Perkinelmer, Walsham, MA, USA) using pressed KBr discs. UV absorption spectra were carried out using a LAMBDA 35 spectrophotometer (Perkinelmer, Walsham, MA, USA). The fluorescent spectra were recorded on a LS-55 fluorescence spectrometer (Perkinelmer, Walsham, MA, USA). Luminescence decay curves were obtained using an FLS-980 fluorescence spectrometer (Edinburgh Instruments, Scotland, UK). The excitation light source for obtaining the fluorescence photos was a ZF1-2 UV analyzer (Shanghai Precision Instrument, Shanghai, China) with UV light (254 nm and 365 nm) and simulated sunlight.