X ray diffractometer model x pert3

Crystalline phase features of the samples were confirmed by X-ray powder diffraction (XRD, PANalytical X-ray Diffractometer Model X pert3). The morphologies of compounds were photo via field emission scanning electron microscopy (SEM, Sigma 500 VP). The distribution of elements on the surface of the samples were measured by Energy Dispersive X-ray spectroscopy (EDX). Oxidation states of the elements were demonstrated by X-ray photoelectron spectroscopy (XPS, Thermo-Fisher ESCALAB250xi). The sulfur loading in the as-samples was detected by thermogravimetric analysis (TGA, Perkin-Elmer TG-7 analyzer). Quantachrome Instrument (Quabrasorb SI-3MP) were employed to characterize N₂ adsorption/desorption measurements.

Transmission electron microscopy (TEM) and Scanning electron microscopy (SEM) images were obtained with a JEOL JEM 2100F TEM at an acceleration voltage of 200 kV and a Carl Zeiss AG instrument (Sigma 500 VP) at an acceleration voltage of 5 kV. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and elemental mapping images were acquired by energy dispersive X-ray spectroscopy (EDS) using a JEOL JEM-2100F electron microscope equipped with a STEM unit. All UV-vis extinction spectroscopy were obtained using a Cary 50 spectrophotometer. X-ray diffraction (XRD) patterns of the as-prepared samples were collected with a PANalytical X-ray Diffractometer Model X pert3 with Cu Kα radiation using a graphite monochromator. Diffraction peaks were recorded in the 30°–90°(2θ) range with a step size of 0.02°.