To evaluate the structural properties of the InN NCs, we employed HR-XRD by means of a MRD Xpert system from Panalytical (Panalytical, Malvern, Worcestershire, UK), which has a Cu radiation in an open detector configuration. The surface morphology was analyzed by using a JEOL JSM-7401F SEM (JEOL, Akishima, Tokyo, Japan). The nanocolumns were additionally studied by HR-TEM images, obtained in a Jeol JEM 2010 (JEOL, Akishima, Tokyo, Japan) operating at , where NCs were peeled off from the substrates and mounted on holey carbon-coated copper grids. Micro-structural properties were studied by micro-Raman spectroscopy (NT-MDT, Integra Spectra, Zelenograd, Moscow, Russia) at room temperature in a backscattering configuration employing the line of a He–Ne laser (Thorlabs Inc, Newton, NJ, USA).
Jsm 7401f sem
Manufactured by JEOL
Sourced in Japan, United Kingdom
The JSM-7401F is a high-resolution field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-quality images and analytical data for a wide range of materials and applications. The JSM-7401F features a field emission electron source, which allows for high resolution imaging at low accelerating voltages. The microscope is equipped with various detectors and analytical capabilities to enable comprehensive characterization of samples.
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3 protocols using jsm 7401f sem
1
Structural Characterization of InN Nanocrystals
2
Freeze-Dried Product Pore Analysis
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The pore dimensions of the products obtained after freeze-drying was analysed using a Scanning Electron Microscope (SEM). Three samples from both the spontaneous and the VISF cycle were examined. Each sample was cut along the vertical axis of the cake, and a central section was mounted onto aluminium stubs with conductive silver paint (Agar Scientific, Stanstead, UK). Samples were sputter coated with 4nm gold and imaged immediately after mounting. Imaging was carried out by a JSM 7401F SEM (Jeol Ltd, Welwyn
Garden City, UK) operating at 5kV. Images were obtained by secondary electron detection. SEM images were recorded at the top, centre and bottom of each cake.
For analysis, approximately 50 pores were selected in each image (at x50 magnification), and each of them was approximated to an ellipse. The diameter of the circle having the same area to perimeter ratio of the approximating ellipse was then assumed as pore dimension, and the numerical average of the obtained distribution was assumed as the average pore size, D p , of the product.
Garden City, UK) operating at 5kV. Images were obtained by secondary electron detection. SEM images were recorded at the top, centre and bottom of each cake.
For analysis, approximately 50 pores were selected in each image (at x50 magnification), and each of them was approximated to an ellipse. The diameter of the circle having the same area to perimeter ratio of the approximating ellipse was then assumed as pore dimension, and the numerical average of the obtained distribution was assumed as the average pore size, D p , of the product.
3
Stability Testing of BSS-PB Compound
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Stability tests at various pH were carried out by immersing 10 mg of BSS-PB in 1 ml of aqueous solution prepared from deionized (DI) water and an amount of HCl stock solution (0.1 M or 0.1 mM) required to reach the desired pH. The suspensions were prepared in 5 mL Pyrex tubes, sealed, and stirred under ambient conditions for 1 h, after which they were centrifuged at 6000 × g for 5 min. The solids were then washed with 20 ml of DI water, centrifuged again (6000 × g for 5 min), and left to dry in ambient conditions prior to PXRD measurements. In-house PXRD measurements were carried out using a Malvern Panalytical X’pert Pro diffractometer (Cu Kα1,2, λ1 = 1.540598 Å, λ2 = 1.544426 Å) using a Bragg−Brentano geometry. Thermogravimetric analysis data were gathered using a TA Instruments Discovery TGA. Scanning electron microscopy images were collected on a JEOL JSM7401F SEM. Calculated (%) for C7H5BiO4 (BSS): C 23.22 H 1.39; measured for BSS-SA (%): C 22.74 H 1.40.
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