Scansyst air probe
The SCANSYST-AIR probe is a non-contact surface analysis tool designed for the characterization of surfaces. It measures the topography and surface properties of samples without physically contacting the surface, allowing for non-destructive analysis.
2 protocols using scansyst air probe
Visualization of Primary Cell Wall Structure
Fluorescence and AFM Characterization
All the AFM measurements were conducted using a Multimode 8 AFM with a Nanoscope V Controller (Bruker Corporation, Beijing, China) in ScanAsyst mode. The measurements were performed in air using a SCANSYST-AIR probe supplied by Bruker Corporation, (Beijing, China).
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