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Scansyst air probe

Manufactured by Bruker
Sourced in China

The SCANSYST-AIR probe is a non-contact surface analysis tool designed for the characterization of surfaces. It measures the topography and surface properties of samples without physically contacting the surface, allowing for non-destructive analysis.

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2 protocols using scansyst air probe

1

Visualization of Primary Cell Wall Structure

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3-d-old dark-grown seedlings were bisected longitudinally and incubated in 2 M KOH at room temperature for 1 h and then in 1% Tween 20 for 30 min. After washing with double-distilled H2O (ddH2O) until pH 7.0 was reached, slices were placed between glass slides, and a load of 5 g was applied for 5 min. The innermost wall layer of primary cell walls was examined by scanning probe atomic force microscope (Bruker MultiMode V with NanoScope V Controller and SCANSYST-AIR probe). Contact AFM was performed in air at room temperature. Images of 2 µm2 size with 512 × 512-pixel resolution were recorded using the software NanoScope Analysis (Version 1.10). At least five areas per cell were scanned, and at least six cells from three samples were analyzed.
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2

Fluorescence and AFM Characterization

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All the fluorescence measurements were performed on a Hitachi F-7000 spectrofluorimeter (Hitachi, Tokyo, Japan). The excitation wavelength was 418 nm, and the spectra were recorded between 570 and 660 nm. The fluorescence emission intensity was measured at 595 nm.
All the AFM measurements were conducted using a Multimode 8 AFM with a Nanoscope V Controller (Bruker Corporation, Beijing, China) in ScanAsyst mode. The measurements were performed in air using a SCANSYST-AIR probe supplied by Bruker Corporation, (Beijing, China).
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