Various analytical methods were used to identify and validate the synthesized SiO2 NPs powder. Field emission scanning electron microscopy (FESEM) was used to examine the morphology of SiO2 NPs (model: MIRA3 TESCAN). Prior to FESEM, the samples were sputtered coated with a very thin layer of gold (Au). The elemental configuration of SiO2 NPs was determined using energy dispersive X-ray spectroscopy (EDX) associated with the FESEM. Aside from that, the crystalline structure of SiO2 NPs was investigated using X-ray diffraction (XRD), patterns (Bruker D8 Discover X-ray Diffraction). A small quantity of small (1 wt %) was scrupulously mixed with potassium bromide (KBr) pellet (FTIR grade) and a disc was prepared. Thereafter prepared pellet was measured through FTIR spectroscope (Bruker FTIR) have in the wave number region of 4000–400 cm−1 (Kumari and Khan 2017 (link)).
D8 discover x ray diffraction
Manufactured by Bruker
The D8 Discover is an X-ray diffraction instrument designed for materials analysis. It is capable of performing powder X-ray diffraction measurements to identify crystalline phases and determine structural parameters of materials.
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2 protocols using d8 discover x ray diffraction
1
Characterization of Synthesized Silica Nanoparticles
2
Characterization of ZnO Nanowires
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The quality of the resultant ZnO nanowire growth was studied with a Hitachi S-4800 scanning electron microscope (SEM) at 10 kV to obtain topographical information such as diameter, shape and density of growth. The SEM was equipped with an Oxford Instruments energy-dispersive x-ray detector (EDX) employed to determine the elemental composition of the grown samples. The EDX was also used to assess changes in the elemental composition of the seed layers with respect to UV exposure time. A Bruker D8 Discover x-ray diffraction (XRD) system, equipped with a Cu_Kα x-ray source and a Lynxeye detector, was employed to evaluate the crystallinity of the as grown ZnO nanowires. Furthermore x-ray photoelectron spectroscopy (XPS) was used to evaluate the structure and composition of the seed layers with respect to UV exposure. The XPS experiments were carried out at room temperature using the Kratos Axis Supra system equipped with a monochromatic Al Kα source having an energy of 1486.6 eV. To investigate surface morphology of the seed layers a JPK Instruments atomic force microscope (AFM) was used in AC mode using tapping mode RTESP AFM probes (Bruker, USA). Images were subsequently analysed using scanning probe image processor (SPIP) image analysis software.
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