X-ray diffractometer (PANalytical Pro, Holland, Almelo, The Netherlands) was used for chemical structure determination and crystal size calculation. Fourier transform infrared was used for confirming the chemical structure, FTIR 340 Jasco spectrophotometer (Easton, WA, USA). A scanning electron microscope was used for determining the morphology of the prepared samples (SEM) (ZEISS, Gemini, Column, Oberkochen, Germany). In the same manner, a transmitted electron microscope was used for determining the internal morphology of the samples (TEM) (JEOL JEM-2100, Oberkochen, Germany). The optical absorption and then the bandgap calculation was determined through the Shimadzu UV/Vis spectrophotometer, Waltham, MA, USA. ImageJ software was used for the calculation of the surface morphology and cross-section.
Gemini column
Manufactured by Zeiss
Sourced in Germany
The GEMINI column is a versatile and high-performance liquid chromatography column designed for analytical and preparative applications. It is capable of separating a wide range of compounds with high efficiency and resolution.
Automatically generated - may contain errors
Lab products found in correlation
Leo 1525, by Zeiss (3 mentions)
Ultra plus, by Zeiss (3 mentions)
Uv vis spectrophotometer, by Shimadzu (1 mentions)
Jem 2100, by JEOL (1 mentions)
Ftir 340 spectrophotometer, by Jasco (1 mentions)
Energydispersive spectroscopy, by Oxford Instruments (1 mentions)
Emxnano, by Bruker (1 mentions)
Asap 2000 surface area analyzer, by Micromeritics (1 mentions)
Evo 18 research, by Zeiss (1 mentions)
Sigma sem, by Zeiss (1 mentions)
Q150t es, by Quorum Technologies (1 mentions)
Supra 40vp, by Zeiss (1 mentions)
K550x sputter coater, by Emitech (1 mentions)
Em 400t microscope, by Philips (1 mentions)
Formvar coated copper grid, by TAAB (1 mentions)
Merlin field emission scanning electron microscope, by Zeiss (1 mentions)
Em ace600 sputter coater, by Leica (1 mentions)
Sigma vp, by Zeiss (1 mentions)
Supra 40vp sem, by Zeiss (1 mentions)
In lens secondary electron detector, by Zeiss (1 mentions)
22 protocols using gemini column
1
Comprehensive Material Characterization Protocol
2
Characterization of Nanomaterials by FE-SEM, EPR, and BET
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Field-emission scanning
electron microscopy (FE-SEM) was performed on an FE-SEM LEO Supra
55 VP along with a GEMINI column (Carl Zeiss, Germany) 5–10
keV (20 mA) in in-lens secondary electron imaging mode with a working
distance of 2–8 mm, equipped with an Oxford Instrument Energy
Dispersive Spectroscopy (EDX) analytical instrument.
Electron
paramagnetic resonance (EPR) spectrometry (EMXnano, Bruker, Germany)
was applied for the detection of radicals during and after the reaction.
The parameters for EPR measurements were set with a modulation frequency
of 100 kHz, a microwave frequency of 9.61 GHz, microwave power of
1.26 mW (19 dB), modulation amplitude of 2.0 G, a sweep width of 200
G, a time constant of 1.28 ms, and five scans. A nitrone spin trapping
agent (5,5-dimethyl-1-pyrroline N-oxide ≥97%,
DMPO, Sigma Aldrich) was used to form stable spin adducts with radicals.
Relative surface area and pore volume analyses were performed by
Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda
(BJH) methods by an ASAP 2000 Surface Area Analyzer (Micromeritics
Instrument Corporation).
electron microscopy (FE-SEM) was performed on an FE-SEM LEO Supra
55 VP along with a GEMINI column (Carl Zeiss, Germany) 5–10
keV (20 mA) in in-lens secondary electron imaging mode with a working
distance of 2–8 mm, equipped with an Oxford Instrument Energy
Dispersive Spectroscopy (EDX) analytical instrument.
Electron
paramagnetic resonance (EPR) spectrometry (EMXnano, Bruker, Germany)
was applied for the detection of radicals during and after the reaction.
The parameters for EPR measurements were set with a modulation frequency
of 100 kHz, a microwave frequency of 9.61 GHz, microwave power of
1.26 mW (19 dB), modulation amplitude of 2.0 G, a sweep width of 200
G, a time constant of 1.28 ms, and five scans. A nitrone spin trapping
agent (5,5-dimethyl-1-pyrroline N-oxide ≥97%,
DMPO, Sigma Aldrich) was used to form stable spin adducts with radicals.
Relative surface area and pore volume analyses were performed by
Brunauer–Emmett–Teller (BET) and Barrett–Joyner–Halenda
(BJH) methods by an ASAP 2000 Surface Area Analyzer (Micromeritics
Instrument Corporation).
3
SEM Analysis of Tomato Roots
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For SEM analysis of bacterial inoculated and control plants (40 days old), the roots of two tomato varieties were collected from the botanical garden and cut into thin transverse sections using an ultramicrotome. The root samples were cleaned 2–3 times using sterilized distilled water just after removing the root-adhering soil and transferred into small screw-capped tubes. The transverse sections were fixed in 2.5% (v/v) glutaraldehyde for 1 h in 0.1 M PBS and then further in 1% (w/v) osmium tetraoxide (OsO4) for 40 min. The fixed samples were dehydrated using ethanol (20−100%; (v/v) for 2–3 min in each concentration) [28 ], and then dried in a critical point dryer, and visualized using a Scanning Electron Microscope with GEMINI column (ZEISS EVO18 Research, Carl Zeiss Microscopy GmbH, Jena, Germany).
4
SEM Imaging of R. equi Biofilms
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SEM was applied to image treated and untreated biofilms of R. equi ATCC 33701 and field isolates by using a FEG LEO 1525 high resolution microscope equipped with a GEMINI column (ZEISS, Jena, Germany). Biofilms were grown on sterile round glass slides at the bottom of 24-well plates for 96 h. After removing planktonic bacteria, biofilms were treated with AZM and RIF alone and in a 2:1 combination at 1 and 10 × MIC for 72 h, as described above. At the end of the incubation period, biofilms were washed with PBS and fixed with 2.5% w/v glutaraldehyde for 1 h and dehydrated with ethyl alcohol at 50% for 10 min, 85% for 10 min, 95% for 15 min, and 100% absolute twice for 10 min each. After drying, the biofilms on the round glass slides were placed onto an aluminum stub covered with carbon tape and coated with chromium at 20 mA for 18 s prior to imaging. Measurements were performed at 5 kV and images are reported at magnifications between 915 X and 65.9 kX.
5
Analyzing Infused Filter Textures
6
SEM-based Sn Precipitation Kinetics
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For investigations of the Sn precipitation kinetics, we constructed a heatable sample holder with built-in temperature sensor to fit into a LEO Supra 35 SEM. This field-emitter SEM is equipped with a Zeiss GEMINI column that allows for in-lens (inLens) detection of so-called SE1 secondary electrons which are predominantly generated by the incident electron beam. In addition, a conventional Everhart-Thornley (SE2) detector is available, which provides a higher degree of material contrast due to a higher sensitivity to SE2 and SE3 electrons that are generated by back-scattered electrons on the sample surface and at structural components of the SEM instrument, respectively40 .
7
Scanning Electron Microscopy of Particle Morphology
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Particle morphology was investigated by scanning electron microscopy (SEM) using a Field Emission SEM (LEO 1525 equipped with a GEMINI column, ZEISS, Oberkochen, Germany). Samples for analysis were prepared by depositing the powder onto an aluminum specimen stub covered with a double-sided adhesive carbon disc. The samples were then coated with chromium before imaging (100 mA, 24 s, 8 nm thickness) (Quorum Q150T ES East Grinstead, West Sussex, UK).
8
SEM Analysis of Hydrated Silica Particles
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For scanning electron microscopic (SEM) analysis of the abrasive and thickening hydrated silica particles (Table 1 , Figure 3 ), a small amount of each of the powders was applied to self-adhesive carbon pads adhering to standard aluminum holders using a spatula. Non-adherent particles were removed by gentle tapping. The samples were coated with an approx. 5 nm thick layer of platinum/palladium (80:20) in a sputtering system (Q150T ES, Quorum TECHNOLOGIES LTD, UK) under rotation at a tilt angle of about 15°. The samples were examined in a Zeiss Sigma SEM with a Gemini column (Zeiss, Oberkochen, Germany). Images were recorded at an acceleration voltage of 5 kV using a 30 µm aperture and an in-lens detector at small working distances (<5 mm) for high resolution.
9
Scanning Electron Microscopy of Nanoparticles
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A field emission Zeiss Supra 40VP scanning electron microscope equipped with a Gemini column was used to locate and image NPs on the strings. High vacuum mode was used. The acceleration voltage was 10 kV. All samples were imaged directly without additional coating.
10
Surface Morphology Analysis via FESEM
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Film surface morphology was investigated by a field emission scanning electron microscope (FESEM) LEO 1525 equipped with a GEMINI column (ZEISS, Germany) equipped with an AsB ® /4QBS detector with 3D Surface Modelling software (ver. 1.5.4). Samples were prepared by casting the polymer, KET, and polymer/KET solutions on a glass slide attached to an aluminium specimen stub by a double sided adhesive carbon disc. CH2Cl2 was allowed to evaporate over-night at room temperature and 24 h under vacuum to remove any residual trace of solvent. Films were sputter coated with gold prior to imaging (Emitech K-550X sputter coater; Emitech, Ashford, UK).
Coating was performed at 20 mA for 4 minutes.
Coating was performed at 20 mA for 4 minutes.
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