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Thermos gravimetric analyzer tg 50

Manufactured by Shimadzu

The Thermos-gravimetric analyzer (TG-50) is a precision instrument designed for thermal analysis. It measures changes in the mass of a sample as a function of temperature or time in a controlled atmosphere. The TG-50 provides accurate and reliable data on sample characteristics, such as thermal stability, decomposition, and phase transitions.

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2 protocols using thermos gravimetric analyzer tg 50

1

Characterization of Catalytic Materials

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Chemicals were purchased from Merck Chemical Company. The purity of the products and the progress of the reactions were accomplished by TLC on silica gel polygram SILG/UV254 plates. FT-IR spectra were recorded on a Shimadzu Fourier Transform Infrared Spectrophotometer (FT-IR-8300). The content of Pd in the catalyst was determined by OPTIMA 7300DV ICP analyzer. TEM analysis was performed using TEM microscope (Philips EM 208S). Thermo-gravimetric analysis (TGA) was performed using a Shimadzu thermos-gravimetric analyzer (TG-50). Vibrating Sample Magnetometer (VSM) analysis was performed using VSM (Lake Shore Cryotronics 7407). Melting points were measured on an electrothermal 9100 apparatus. XPS analyses were performed using a VG-Microtech Multilab 3000 spectrometer, equipped with an Al anode. The deconvolution of spectra was carried out by using Gaussian–Lorentzian curves.
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2

Multitechnique Characterization of Catalysts

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Chemicals were purchased from Merck Chemical Company. NMR spectra were recorded on a Bruker Avance DPX-400 and 300 using deuterated CDCl3 and DMSO-d6 as solvent and TMS as internal standard. The purity of the products and the progress of the reactions were accomplished by TLC on silica-gel polygram SILG/UV254 plates. TEM analysis was performed using TEM microscope (Philips EM 208S). EDS mapping were found using a TSCAN MIRA3. FT-IR spectra were recorded on a Shimadzu Fourier Transform Infrared Spectrophotometer (FT-IR-8300). Thermal gravimetric analysis (TGA) was performed using a Shimadzu thermos-gravimetric analyzer (TG-50). X-ray diffraction (XRD) was done on a Bruker D8-advance X-ray diffractometer with Cu Kα (λ = 0.154 nm) radiation. XPS analyses were performed using a VG-Microtech Multilab 3000 spectrometer, equipped with an Al anode. The deconvolution of spectra was carried out by using Gaussian–Lorentzian curves. The Pd and Co content on the catalyst was determined by OPTIMA 7300DV ICP analyzer. Qualitative elemental analysis was determined and analyzed by CHNO elemental analyzer (Thermo Finnigan, FLASH EA 1112 series, Italy).
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