Afm cantilever
The AFM cantilever is a critical component in an atomic force microscope (AFM) system. Its primary function is to act as a probe that interacts with the sample surface, enabling the measurement of surface topography and other physical properties at the nanoscale level.
Lab products found in correlation
2 protocols using afm cantilever
Nanoindentation for Fibroblast Stiffness
Measuring Cellular Elasticity via AFM
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