Electrochemical impedance spectroscopy (EIS) was performed using an electrochemical workstation (CHI660E, Chenhua, Shanghai, China). A three-electrode system was constructed to detect the charge transfer resistance of the cathode. The saturated calomel electrode (CHI150, Chenhua, Shanghai, China) was used as the reference electrode. The EIS was operated in the frequency range of 10 mHz~100 kHz with an amplitude of 10 mV. The Nyquist diagram was fitted to the equivalent circuit using ZView software. After the heavy metals were detected by the SMFC-based biosensor, four groups of SMFC cathode carbon felt (0.25 cm2) were cut and their elemental and chemical states on the cathode surface were characterized by an X-ray photoelectron spectrometer (PHI-1600, PerkinElmer, Waltham, MA, USA). The concentrations of ICP in water samples were also quantified with ICP-MS (ICPE-9000, Shimadzu, Japan) using the method described elsewhere [23 (link),24 (link)].
Phi 1600
Manufactured by PerkinElmer
Sourced in United States
The PHI 1600 is an X-ray photoelectron spectroscopy (XPS) system designed for materials analysis. It provides quantitative information about the chemical composition and electronic structure of a sample surface.
Automatically generated - may contain errors
Lab products found in correlation
Icpe 9000, by Shimadzu (1 mentions)
Chi660e, by Chenhua (1 mentions)
Chi150, by Chenhua (1 mentions)
Miniflex 600, by Rigaku (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Ft ir 4100, by Jasco (1 mentions)
Axs d8 advance, by Bruker (1 mentions)
Jem 2100, by JEOL (1 mentions)
Jem 2010, by JEOL (1 mentions)
D2 phaser, by Bruker (1 mentions)
D max 2500, by Rigaku (1 mentions)
X max, by Oxford Instruments (1 mentions)
Advance 600 mhz spectrometer, by Bruker (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Tensor 27, by Bruker (1 mentions)
U 3900, by Hitachi (1 mentions)
7 protocols using phi 1600
1
Electrochemical Characterization of SMFC Cathode
2
X-Ray Photoelectron Spectroscopy of Pb(II) Adsorption
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The valence state of Pb absorbed on Q-AN was determined by X-ray photoelectron spectrometer (PHI 1600, PerkinElmer, USA). Experiments of Q-AN and adsorption of Pb(II) in this characterization was conducted in nitrogen atmosphere to avoid interference of oxygen in air. Measurement was carried out with an AlK (hλ = 1667.0 eV) X-ray source at 250.0 W and pass energy of 29.35 eV for high-resolution analyses. Vacuum in analysis chamber was kept below 3 × 10−6 Pa during measurement. Binding energy of spectra was calibrated with aliphatic carbons C1s (284.6 eV).
3
Characterization of Graphene Oxide Membranes
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The synthesized
GO nanosheets
were analyzed by X-ray diffraction (XRD) using Cu Kα radiation
(MiniFlex600; Rigaku). The presence of oxygen-containing functional
groups on GO was analyzed by Fourier transform infrared (FT-IR) spectroscopy
(FTIR4100; JASCO) and X-ray photoemission spectroscopy (XPS, PHI 1600;
PerkinElmer). GO membranes synthesized by the above method were used
for the XRD, FT-IR, and XPS analyses. The morphology of the GO membrane
was analyzed by scanning electron microscopy (SEM, JSM-7600F; JEOL).
The proton conductivity of the GO membrane was examined by complex
impedance spectroscopy. Pt electrodes were sputtered onto both sides
of the membrane, and the electrical contacts were composed of Ni meshes
and Ni wires. The impedance was measured in air under humid conditions
(2–90% RH) at room temperature by an impedance analyzer (1260;
Solartron).
GO nanosheets
were analyzed by X-ray diffraction (XRD) using Cu Kα radiation
(MiniFlex600; Rigaku). The presence of oxygen-containing functional
groups on GO was analyzed by Fourier transform infrared (FT-IR) spectroscopy
(FTIR4100; JASCO) and X-ray photoemission spectroscopy (XPS, PHI 1600;
PerkinElmer). GO membranes synthesized by the above method were used
for the XRD, FT-IR, and XPS analyses. The morphology of the GO membrane
was analyzed by scanning electron microscopy (SEM, JSM-7600F; JEOL).
The proton conductivity of the GO membrane was examined by complex
impedance spectroscopy. Pt electrodes were sputtered onto both sides
of the membrane, and the electrical contacts were composed of Ni meshes
and Ni wires. The impedance was measured in air under humid conditions
(2–90% RH) at room temperature by an impedance analyzer (1260;
Solartron).
4
Comprehensive Material Characterization Protocol
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The X-ray diffraction (XRD) of samples was carried out using a Bruker AXS D8 Advance diffractometer with copper radiation (Kα of λ = 1.54 Å). The X-ray photoelectron spectra (XPS) data were obtained by X-ray photoelectron spectroscopy (XPS, Perkin-Elmer model PHI 1600). The microstructures of the samples were investigated by scanning electron microscope (SEM, Nova NanoSEM 200). Transmission electron microscopy observations were conducted using JEOL JEM-2100 operated at 200 kV. N2 adsorption/desorption was determined by Brunauer-Emmett-Teller (BET) measurements using Micromeritics instrument.
5
Structural and Electronic Properties of ITZO-Bi2Se3 Nanocomposites
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The crystallographic orientations and fine structures of the ITZO thin films and Bi2Se3 and ITZO/Bi2Se3 NPs were examined using high-resolution transmission electron microscopy (HRTEM; JEOL JEM-2010) and X-ray diffraction (XRD) spectroscopy (Bruker D2 PHASER, Cu Kα radiation, λ = 1.5405 Å, operating at 40 kV and 30 mA). The sample morphologies were examined using field-emission scanning electron microscopy (FESEM; JOEL JSM-6335F). The binding vibration modes were analyzed via Raman spectroscopy (3D Nanometer-scale Raman PL microspectrometer) using a semiconductor laser with an excitation energy of 2.54 eV. The chemical binding energies and valence states of the elements were analyzed using X-ray photoelectron spectroscopy (XPS; Perkin-Elmer model PHI 1600, operating at 250 W) with Mg Kα X-rays (1253.6 eV). The electrical properties, i.e., the bulk carrier concentration, carrier mobility, resistivity, and conductivity, were evaluated via Hall effect measurements (Ecopia HMS-3000 Hall Measurement System) at room-temperature under an input current of 5 mA and a magnetic flux density of 0535 T.
6
Characterization of Cr/CeO2 Nanozyme
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TEM and X-ray spectroscopy (EDX) elemental mapping images of as-prepared Cr/CeO2 nanozyme sample were taken on a JEOL-2000EX transmission electron micrograph, with accelerating voltage of 200 kV. X-ray diffraction technology was used to investigate the crystal structure of XRD spectra were conducted on X-ray Powder diffractometer (D/MAX-2500, Rigaku, Japan) with Cu Kα radiation. The valence states of elements measured by X-ray photoelectron spectrometer (PHI 1600, Perkin Elmer, USA) with the Al Kα excitation. Optical properties were measured characterized by ultraviolet-visible (UV-vis) absorption spectroscopy operating at a Varian Lambda 750 UV-VIS NIR instrument (Shimadzu, Japan) while the cuvette was utilized to contain Cr/CeO2 nanozyme hydration solutions.
7
Characterization of Immobilized Pt Catalysts
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The immobilized Pt catalysts and other intermediates were characterized using infrared spectroscopy (IR, TENSOR 27, Bruker, Germany), transmission electron microscopy (TEM, JEM 2100F, JEOL Ltd., Japan), high-resolution transmission electron microscopy (HRTEM, JEM 2100F, JEOL Ltd., Japan), energy dispersive X-ray spectroscopy (EDS, X-Max, Oxford Instruments Ltd., Britain) and X-ray photoelectron spectroscopy (XPS, PHI-1600, PerkinElmer, US). Residual H2PtCl6 solutions were characterized using an ultraviolet-visible spectrophotometer (UV, U-3900, Hitachi, Japan). Pt loading was analyzed using an atomic absorption spectrophotometer (AAS, 180-80, Hitachi, Japan). The hydrosilylation products and diethylenetriaminepentaacetic dianhydride (DTPAD) were identified using a Bruker Advance 600 MHz spectrometer (Bruker, Germany). The quantitative analysis of all hydrosilylation products were analyzed using GC with a capillary column (30 m × 0.25 mm × 0.25 μm) coated with 5% phenyl and 95% methyl polysiloxane.
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