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Nss software

Manufactured by Thermo Fisher Scientific

The NSS software is a data analysis and visualization tool developed by Thermo Fisher Scientific. It provides a platform for processing and analyzing data from various scientific instruments. The software offers core functionalities for data management, analytical tools, and visualization capabilities to support scientific research and investigations.

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3 protocols using nss software

1

Cryogenic STEM Imaging and EDS Analysis

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A Hitachi HD-2300A equipped with Thermo Scientific NORAN System 7 EDS detectors was operated at 200 kV for STEM imaging in ADF, HAADF, BF, and SE modes as well as for EDS analysis. A JEOL JEM-3200FS was operated at 300 kV for HRTEM. In both microscopes, Gatan 626 single tilt liquid nitrogen cryo transfer holders were used to support the samples. The samples were inserted into the microscope column and then cooled down to cryogenic conditions under vacuum by liquid nitrogen before electron irradiation. In situ (HA)ADF movies were recorded at a resolution of 512 px × 512 px, a scan area of 51.79 nm × 51.79 nm, and pixel dwell times of 20 μs (Movie S1) or 7.5 μs (Movie S2). The probe current was 0.168 nA. EDS analysis was performed after fixing the area of interest by scanning the area using a lower flux electron beam until the nanoparticles did not grow further. EDS of individual nanoparticles was performed with manual drift correction based on the HAADF signal. EDS quantification was performed with the Thermo Scientific NSS software after background removal and matrix correction by the Proza method (Phi-Rho-Z). A Gatan K2 Summit direct electron detector was used for HRTEM imaging at a resolution of 3710 px × 3838 px (pixel size is 0.013 nm for the imaging conditions used).
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2

Nanostructure Analysis by Advanced TEM

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High-resolution TEM (HRTEM) with energy dispersive X-ray analysis (EDX) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) were performed using JEOL JEM-ARM200F and JEM-ARM200CF with an acceleration voltage of 200 kV. The JEOL Analysis Station software and Thermo Scientific NSS software were used to control the STEM-EDX mapping. To minimize the effect of sample drift, a drift-correction mode was used during acquisition of the elemental map. The STEM probe size was ~0.13 nm, generating ~140 pA of current when 40 μm of the condenser lens aperture was inserted. The collection angle of the HAADF detector was ~97-256 mrad.
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3

SEM-EDX Analysis of Textile Fibres

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Few fibres, from the 28 selected experimentally-dyed samples (prior to ageing) and from the historical samples, were fixed on carbon adhesive over aluminium stubs for SEM-EDX analyses. Samples were observed with a SEM, JSM5910LV from JEOL, to assess possible contaminating particles on the textile fibres, using 20 kV accelerating voltage, 11 mm working distance, 48 spotsize, and backscattered signal (BES) at 40 Pa. EDX analyses were undertaken using a SDD detector from Thermo Fisher scientific and a NSS software. Analyses were undertaken on regions free of contaminating particles to evaluate the presence of mordants and additives, using 80 s live time and pulse processor with projected maximum throughput of 71400 cps. Owing to the non-uniform surface and variable thickness of the fibres, EDX analyses were performed three times for each sample, to obtain a qualitative assessment of the elements present.
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