Jem arf200f tem stem

Manufactured by JEOL

The JEM-ARF200F is a transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) produced by JEOL. It is designed for high-resolution imaging and analysis of materials at the atomic scale.

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Lab products found in correlation

X pert pro super diffractometer, by Philips (2 mentions) Miniflex 600 powder diffractometer, by Rigaku (1 mentions) Asap 2460, by Micromeritics (1 mentions) X pert pro x ray diffractometer, by Philips (1 mentions) Solidspec 3700duv, by Shimadzu (1 mentions) H7650 microscopy, by Hitachi (1 mentions) Invia raman microscope, by Renishaw (1 mentions) Jsm 6700f, by JEOL (1 mentions) Jsm 6700f sem, by JEOL (1 mentions) Escalab 250xi spectrometer, by Thermo Fisher Scientific (1 mentions)

5 protocols using jem arf200f tem stem

Comprehensive Materials Characterization

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The HRTEM (JEOL-2011) is operated at an accelerating voltage of 200 kV. The high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and corresponding energy-dispersive spectroscopy (EDS) mapping analyses are executed on JEOL JEM-ARF200F TEM/STEM with a spherical aberration corrector. TGA is carried out using Shimadzu-50 thermoanalyser under flowing Ar atmosphere with a heating rate of 10 °C min⁻¹. The XPS is performed on ESCALAB 250 X-ray photoelectron spectrometer using Al Ka radiation. The X-ray absorption near edge structure (XANES) of Mg K-edge is investigated at the BL08U1A beamline of Shanghai Synchrotron Radiation Facility (SSRF). The adsorption curves are treated by normalized process.

Liu S., Li Z., Wang C., Tao W., Huang M., Zuo M., Yang Y., Yang K., Zhang L., Chen S., Xu P, & Chen Q. (2020). Turning main-group element magnesium into a highly active electrocatalyst for oxygen reduction reaction. Nature Communications, 11, 938.

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Electrochemical Characterization of Catalysts

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All reagents were used as received.
LSV tests were performed using an electrochemical workstation (Princeton Applied Research 263 A) with a three-electrode system in typical divided electrochemical cell separated by Nafion®117 (Dupond) membrane between cathode and anode. Gas phase products were analyzed by Gas Chromatography (SRI 8610 C). Microstructure images were taken using field emission scanning electron microscope (FEI JEOL-7800F). High-resolution TEM images as well as element mapping were obtained using transmission electron microscope (JEM-2100F). Aberration-corrected HAADF-STEM characterization was carried on a JEOL JEM-ARF200F TEM/STEM. X-ray diffraction spectra were taken by a Rigaku MiniFlex 600 powder diffractometer. N₂ adsorption-desorption was performed using a Micromeritics ASAP 2460 instrument. CO₂ adsorption was carried out using Quantachrome Autosorb-IQ2-MP. X-ray photoelectron spectra were taken with ThermoVG Scientific ESCALAB 250 X-ray photoelectron spectrometer. The X-ray absorption find structure spectra, including XANES and EXAFS at Ni K-edge, were collected at 1W1B station in Beijing Synchrotron Radiation Facility.

Yang H., Lin Q., Zhang C., Yu X., Cheng Z., Li G., Hu Q., Ren X., Zhang Q., Liu J, & He C. (2020). Carbon dioxide electroreduction on single-atom nickel decorated carbon membranes with industry compatible current densities. Nature Communications, 11, 593.

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Comprehensive Characterization of Novel Materials

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The samples were characterized by X-ray powder diffraction (XRD, performed on a Philips X'pert PRO X-ray diffractometer, Cu Kα, λ = 1.54182 Å). Absorption spectra were collected using a spectrophotometer (Shimadzu SolidSpec-3700DUV). SEM was recorded on a JEOL JSM-6700F microscopy. TEM was collected using a Hitachi H-7650 microscopy. Raman spectra were taken at room temperature using an inVia Raman Microscope (Renishaw) with 785 nm incident laser excitation. HRTEM, SAED, HAADF-STEM and corresponding STEM-EDX analyses were done on a JEOL JEM-ARF200F TEM/STEM with a spherical aberration corrector. Wide angle X-ray scattering (WAXS) detection was characterized at the BL14B station of Shanghai Synchrotron Radiation Facility (SSRF) with X-ray photon energy of 18 keV (λ = 0.6887 Å).

Qian Y., Xu K., Cheng L., Li C, & Wang X. (2021). Rapid, facile synthesis of InSb twinning superlattice nanowires with a high-frequency photoconductivity response. RSC Advances, 11(32), 19426-19432.

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Comprehensive Structural Characterization of Materials

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XRD was conducted on a Philips X’Pert Pro Super diffractometer (with Cu Kα, λ = 1.54182 Å). The XPS was performed at the photoemission end-station (BL10B) in the National Synchrotron Radiation Laboratory, Hefei. Field emission scanning electron microscopy was carried out on the JEOL-JSM-6700F, while the high-resolution transmission electron microscopy, HAADF-STEM, and energy-dispersive spectroscopy (EDS) mapping analyses were performed on the JEOL JEM-ARF200F TEM/STEM with a spherical aberration corrector. The XAFS spectra were collected at the 14W1 station in the Shanghai Synchrotron Radiation Facility. The collected EXAFS data were analyzed using the ATHENA program as implemented in the IFEFFIT software packages according to the standard procedures. The k²-weighted EXAFS spectra were achieved by pre-edge background deduction and then normalized relative to the edge-jump step, and the plotting k-weight was 2.

Cai J., Song Y., Zang Y., Niu S., Wu Y., Xie Y., Zheng X., Liu Y., Lin Y., Liu X., Wang G, & Qian Y. (2020). N-induced lattice contraction generally boosts the hydrogen evolution catalysis of P-rich metal phosphides. Science Advances, 6(1), eaaw8113.

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Characterization of Palladium Catalysts

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A Philips X’Pert Pro Super diffractometer was utilized to detect X-ray powder diffraction (XRD), with a wavelength of 1.54178 Å for Cu-Kα radiation. SEM was performed using a JEOL JSM-6700F SEM. TEM was performed using a Hitachi H-7700 operated at 100 kV. A JEOL JEM-ARF200F TEM/STEM was used to execute high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and corresponding energy-dispersive X-ray spectroscopy mapping. The X-ray photoelectron spectra were carried out using a Thermo ESCALAB250Xi spectrometer (monochromatized Al Kα as the excitation source, hν = 1486.6 eV) and a pass energy of 30 eV, with the binding energies being calibrated using the C 1-s peak of contaminant carbon at 284.80 eV. The dissolution of Pd in durability was recorded with an inductively coupled plasma–atomic emission spectrometer using an Optima 7300 DV (PerkinElmer Corporation).

Peng J., Sun H., Ni K., Wu J., Sun X., Su Y., Cheng H., Liu Y., Guo Y., Bi W., Zhu Y., Wu C, & Xie Y. (2022). Hierarchical palladium catalyst for highly active and stable water oxidation in acidic media. National Science Review, 10(2), nwac108.

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