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80 mm2 x max silicon drift detector

Manufactured by Oxford Instruments
Sourced in United States, United Kingdom

The 80 mm2 X-Max silicon drift detector is a compact and high-performance X-ray detector. It features a large active area of 80 mm2 and is designed to provide efficient X-ray detection and analysis. The detector utilizes advanced silicon drift technology to deliver high energy resolution and low noise performance.

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7 protocols using 80 mm2 x max silicon drift detector

1

Analyzing Coated and Uncoated CRV Particles

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To study the morphology of coated and uncoated amorphous CRV particles, scanning electron microscopy (SEM) images were acquired using a Hitachi TM3030 tabletop microscope (Hitachi High-Technologies Europe GmbH, Krefeld, Germany) operated at an accelerating voltage of 15 kV. Samples were sputter-coated with gold (Cressington 108 auto, Cressington Scientific Instruments, Watford, UK) prior to SEM analysis.
The CRV distribution inside the stored coated amorphous CRV particles was studied by elemental mapping of cross-sections for the characteristic X-ray peak of nitrogen. The elemental distributions were investigated by environmental scanning electron microscopy (FEI Quanta 200 ESEM FEG, Hillsboro, OR, USA) combined with energy-dispersive X-ray (EDX) spectroscopy using an Oxford Instruments 80 mm2 X-Max silicon drift detector. The EDX images were analyzed using AZtecLive software (Oxford Instruments, Bristol, UK).
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2

TEM Characterization of Tissue Nanostructure

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The FIB TEM ultrathin sections were observed by TEM (JEM-1400, JEOL, Japan) at an acceleration voltage of 100 kV. TEM images were photographed at high and low magnifications to fully capture the nanostructure features of the tissue. The diffraction patterns of the samples were recorded digitally using a selected-area aperture allowing observation of a circular area of 100 nm diameter. In situ Energy dispersive X-ray (EDS) analysis was also performed using 80 mm2 X-max Silicon Drift Detector (Oxford Instruments, UK). The Calcium-to-phosphate (Ca/P) ratios were calculated as the ratio between the atomic percentages of the two elements. Ca/P ratios were reported as averages ± standard deviation.
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3

Scanning Electron Microscopy of Catheters

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Catheters were dissected as described above for conventional SEM, before being mounted using Tissue-Tek CRYO-OCT compound mountant (Agar Scientific). Stubs were placed onto a liquid-cooled Deben CoolStage at a temperature of c. 1.5 °C and viewed using the same Zeiss-evo LS15 microscope (Carl Zeiss Ltd) used for SEM, operating in extended pressure (EP) mode, and using the following parameters and conditions: 100-μm upper EP aperture, 500-μm lower EDS EP aperture, a chamber pressure of 500–560 pa with c. 85% humidity, an accelerating voltage of 20 kV EHT and using a five quadrant backscatter detector. EDS spectra from areas of interest were obtained using an 80-mm2 X-max silicon drift detector (Oxford instruments, UK). EDS data were analysed using the Aztec software to produce EDS spectra (Oxford instruments).
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4

SEM and EDS Analysis of ENDS

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A Thermo FEI Quanta 250 field emission gun scanning electron microscope (SEM, Hillsboro, Oregon, USA) with Oxford energy dispersive X-ray spectroscopy attachment with 80 mm2 X-Max silicon drift detector and Aztec software (EDS, Oxford Instruments, Concord, MA, USA) was used to identify ENDS components as possible sources for metals in the ENDS liquids and aerosols. Data were obtained in low vacuum mode at 40 Pa vapor pressure with 20 kV accelerating voltage using a large field detector. Light microscopy was performed using an Olympus (Center Valley, PA, USA) SZX16 stereo microscope with transmitted light base, DP73 camera, Cellsense operating system, and Fostec illuminator.
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5

Hydrogel Porosity Characterization by SEM

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In order to determine the porosity of the hydrogels SEM analysis were performed. SEM images were acquired with SEM Quanta FEG 250 Analytical ESEM instrument operating at an accelerating voltage 2 kV in high vacuum mode after gold sputtering the freeze dried hydrogels with 5 nm. ImageJ software was used to measure the pore size of the collected SEM images and average pore size was calculated from at least 40 measurements from each sample. EDAX analysis was performed with Oxford Instruments 80 mm 2 X-Max silicon drift detector connected to the SEM instrument after gold sputtering with 5 nm.
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6

Characterization of Cs2Ag(Bi:Fe)Br6 Crystals

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The optical absorption measurements were carried out using a PE Lambda 950 ultraviolet-visible spectrophotometer. XRD patterns of the products were recorded with a X’Pert PRO x-ray diffractometer using Cu Kα1 irradiation (λ = 1.5406 Å). Energy-dispersive x-ray spectroscopy analysis was performed using an LEO 1550 scanning electron microscope operated at 20-kV accelerating voltage, with an Oxford Instruments X-Max 80-mm2 Silicon Drift Detector. ICP-OES measurements were carried out using a PerkinElmer Avio 500 spectrometer with the Cs2Ag(Bi:Fe)Br6 crystal powder dissolved in aqua regia. XPS of Cs2Ag(Bi:Fe)Br6 crystals was performed using a Scienta ESCA200 spectrometer with a base pressure of 2 × 10−10 mbar (ultrahigh vacuum) and monochromatized Al (Kα) radiation (hν = 1486 eV). NEXAFS spectroscopy and SR-XPS measurements were performed at the Elettra synchrotron radiation facility in Trieste, Italy. Specific heat (Cp) measurement was performed using physical property measurement system (PPMS-9 T) Quantum Design Co. with Cs2Ag(Bi:Fe)Br6 crystals.
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7

Transmission Electron Microscopy: Advanced Techniques

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Ultra-thin sections were examined in transmission electron microscopes JEM1011 and JEM-2100 (Jeol, Japan) with accelerating voltages of 80 kV and 200kV, respectively, and magnification of x13000-21000. Images were recorded with Ultrascan 1000XP and ES500W CCD cameras (Gatan, USA). Tomograms were obtained from semi-thick (300–400 nm) sections using the Jeol Tomography software (Jeol, Japan). The tilting angle of the goniometer ranges from -60° to +60° (with a permanent step of 1 degree). A series of images were aligned by the Gatan Digital Micrograph (Gatan, USA) and then recovered with the back-projection algorithm in IMOD4.9. 3D sub-tomograms were visualized in the UCSF Chimera package [36 (link)].
Analytical electron microscopy was carried out on an analytical transmission electron microscope JEM-2100 (Jeol, Japan), equipped with a bright field detector for scanning transmission electron microscopy (SPEM) (Jeol, Japan), a High Angular Angle Dark Field detector (HAADF) (Gatan, USA), an X-Max 80 mm2 Silicon Drift Detector (Oxford Instruments, UK), and a GIF Quantum ER energy filter (Gatan, USA). Scanning transmission EM (STEM) and TEM modes were used. The STEM probe size was 15 nm. Energy-dispersive X-ray (EDX) spectra collection and element analyses were performed in the INCA program (Oxford Instruments, UK).
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