The CRV distribution inside the stored coated amorphous CRV particles was studied by elemental mapping of cross-sections for the characteristic X-ray peak of nitrogen. The elemental distributions were investigated by environmental scanning electron microscopy (FEI Quanta 200 ESEM FEG, Hillsboro, OR, USA) combined with energy-dispersive X-ray (EDX) spectroscopy using an Oxford Instruments 80 mm2 X-Max silicon drift detector. The EDX images were analyzed using AZtecLive software (Oxford Instruments, Bristol, UK).
80 mm2 x max silicon drift detector
The 80 mm2 X-Max silicon drift detector is a compact and high-performance X-ray detector. It features a large active area of 80 mm2 and is designed to provide efficient X-ray detection and analysis. The detector utilizes advanced silicon drift technology to deliver high energy resolution and low noise performance.
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7 protocols using 80 mm2 x max silicon drift detector
Analyzing Coated and Uncoated CRV Particles
The CRV distribution inside the stored coated amorphous CRV particles was studied by elemental mapping of cross-sections for the characteristic X-ray peak of nitrogen. The elemental distributions were investigated by environmental scanning electron microscopy (FEI Quanta 200 ESEM FEG, Hillsboro, OR, USA) combined with energy-dispersive X-ray (EDX) spectroscopy using an Oxford Instruments 80 mm2 X-Max silicon drift detector. The EDX images were analyzed using AZtecLive software (Oxford Instruments, Bristol, UK).
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