The in situ modified SiO2 in NR latex was investigated using transmission electron microscopy (TEM; JEM-1400, JEOL, Japan) under an electron beam with an accelerating voltage of 80 kV. 29Si solid-state nuclear magnetic resonance spectroscopy (NMR) at 400 MHz (JEOL, JNM-ECZ-400R/S1, Japan) and Fourier transform infrared spectroscopy (FTIR; Thermo Fischer, Nicolet iS5, USA) with attenuated total reflection (ATR) mode over a wavenumber range of 4000 to 400 cm−1 with 32 scans at a 4 cm−1 resolution were used to confirm the in situ modified SiO2 generated in the NR matrix in terms of solid state without SSM. The surface morphology of the CSSMs was characterized using SEM (JSM-6610LV, JEOL, Japan) with an accelerating voltage of 15 kV. The static WCA was measured at ambient temperature by a contact angle goniometer (200-F1, Ramé-hart, USA) after applying a 6-μL distilled water droplet on the surface with a micro-syringe. For each sample, three water droplets were applied and measured.
Jnm ecz 400r s1
Manufactured by JEOL
Sourced in Japan
The JNM-ECZ-400R/S1 is a high-performance nuclear magnetic resonance (NMR) spectrometer designed for analytical and research applications. It operates at a frequency of 400 MHz and is equipped with a superconducting magnet. The spectrometer is capable of performing various NMR experiments, including 1D and 2D experiments, to analyze the structure and properties of chemical compounds.
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Lab products found in correlation
Nicolet is5, by Thermo Fisher Scientific (1 mentions)
Jem 1400, by JEOL (1 mentions)
Jsm 6610lv, by JEOL (1 mentions)
Dxr smartraman, by Thermo Fisher Scientific (1 mentions)
Evo ma10, by Zeiss (1 mentions)
Smartlab, by Rigaku (1 mentions)
Spectrum two, by PerkinElmer (1 mentions)
Tg 209 f3 tarsus, by Netzsch (1 mentions)
3 protocols using jnm ecz 400r s1
1
In-situ Modified SiO2 in NR Latex
2
NMR Characterization of CLP and DLP
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1H and 13C NMR spectra of both CLP and DLP were obtained with an NMR spectrometer (JNM-ECZ400R/S1, JEOL Ltd., Tokyo, Japan) using a sample of 20 mg/mL in D2O (0.5 mL, 99.9%). Chemical shifts are reported in ppm.
3
Detailed Physicochemical Characterization of Materials
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The purity of RHS was confirmed by a Raman spectrometer (DXR SmartRaman, Thermo Scientific). The crystallography of materials was analyzed by X-ray diffraction (XRD) technique (SmartLab, Rigaku). The surface area and porosity of materials were studied by N2 adsorption-desorption analysis technique (autosorb iQ, Quantachrome instruments) where the samples were degassed at 300 °C for 6 h with a heating rate of 10 °C min−1 before measurement. The structure and functional groups of materials were carried out by Fourier-transform infrared (FT-IR) spectroscopy (Spectrum Two, PerkinElmer). The thermal stability of materials was evaluated by Thermogravimetric analyzer (TG 209 F3 Tarsus, NETZSCH) under the N2 atmosphere. The morphology and composition of materials were observed by scanning electron microscopy (SEM) with the energy dispersive X-ray (EDX) spectroscopy (EVO MA10, Zeiss). The chemical identity of the samples was investigated by solid-state Nuclear magnetic resonance (NMR) spectroscopy (JNM-ECZ-400 R/S1, JEOL) at 400 MHz. The acidity was studied by NH3-TPD analysis (Belcat B, BEL JAPAN, Inc.) where the process for ammonium desorption analysis was carried out according to the literature [27 ].
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