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4 protocols using ir 200 spectrometer

1

Spectroscopic Analysis of New Compounds

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New compounds were identified by NMR and were further analyzed with a Bruker Avance DRX500 spectrometer (1H—500.13 MHz) equipped with a five mm triple resonance inverse Cryoprobe TXI (1H/13C/15N) in CDCl3-99.8%, (δ1H = 7.26 pm, δ13C = 77.16 ppm). The HR-ESI-MS data were collected using a QStar Elite mass spectrometer (Applied Biosystems SCIEX, Concord, ON, Canada) equipped with an ESI source operated in positive ion mode. Optical rotations were measured with a Perkin-Elmer 241 polarimeter equipped with a sodium (589 nm) lamp and a one dm cell. The FTIR spectra were established with a Thermo-Nicolet IR 200 spectrometer (Waltham, MA, USA) on a KBr cell and four cm−1 resolution.
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2

Comprehensive Characterization of Nanoparticles

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Transmission Electron Microscope (TEM) images were obtained with a JEM-2010 microscope (JEOL, Japan) at an accelerating voltage of 120 kV. The samples were prepared by drop-casting a dilute solution of particles onto carbon-coated copper grids, followed by air drying. FT-IR spectra were recorded on an IR 200 spectrometer (Thermo Nicolet, USA) using KBr pellets. X-Ray photoelectron spectroscopy (XPS) was performed on a Thermo Fisher ESCALAB Xi+. Thermogravimetric analysis (TGA) was performed on a Mettler TGA/SDTA851e° instrument (Switzerland) at a heating rate of 5 °C min−1 from 30 to 700 °C under N2 atmosphere. Magnetic property was measured by vibrating sample magnetometry (VSM) on a model 2000 physical property measurement system (Quantum Design) at room temperature. Zeta potentials of samples were determined on a dynamic light scattering (DLS) instrument (Zetasizer Nano-ZS, Malvern Instruments, UK).
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3

Elemental, Spectral, and Thermal Analysis

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Elemental analyses (C, H, N) were performed on a Leco CHNS-932 microanalyzer. IR spectra were acquired on diluted KBr pellets in a ThermoNicolet IR 200 spectrometer in the 4000–400 cm−1 spectral region. Thermal analyses (TG/DTA) were performed on a TA Instruments SDT 2960 thermal analyzer in a synthetic air atmosphere (79% N2/21% O2) with a heating rate of 5 °C·min−1.
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4

Comprehensive Characterization of Nanoparticles

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Transmission electron microscope (TEM) images were obtained with a JEM-2010 microscope (JEOL, Japan) at an accelerating voltage of 120 kV. The samples were prepared by drop-casting a dilute solution of particles onto carbon-coated copper grids, followed by air drying. High-resolution transmission electron microscopy (HRTEM) images were obtained on a field-emission electron microscope (FEI Talos F200x, USA) equipped with a Super X energy spectrum. X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Fischer ESCALAB 250Xi (USA). Structural information of the samples was obtained by X-ray diffractometer-6100 diffractometer (Shimadzu, Japan). Fourier transform infrared spectrometry (FT-IR) analysis was conducted on an IR 200 spectrometer (Thermo Nicolet, USA) using KBr pellets. Thermogravimetric analysis (TGA) was performed on a Mettler TGA/SDTA851e° instrument (Switzerland) at a heating rate of 5 °C min−1 from 30 to 700 °C under N2 atmosphere. The magnetism of the samples was measured with a vibrating sample magnetometer (VSM) on a model 2000 physical property measurement system (Quantum design) at room temperature.
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