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U 3900 uv spectrophotometer

Manufactured by Hitachi

The Hitachi U-3900 UV spectrophotometer is a versatile instrument designed for accurate and reliable absorbance measurements in the ultraviolet and visible light spectrum. It features a high-performance optical system and advanced data processing capabilities to provide precise and reproducible results for a wide range of applications.

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2 protocols using u 3900 uv spectrophotometer

1

Multimodal Characterization of Nanomaterials

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UV-Vis spectra were collected by a U-3900 UV spectrophotometer (Hitachi) ranging from 200 to 800 nm with DI water as the solvent. The fluorescent spectra were measured in aqueous dispersion by a fluorescence spectrophotometer (F-4600, Hitachi). X-ray diffraction (XRD) patterns were obtained from a X-ray diffraction (DX-2700, λ = 1.5406 Å) to investigate the phases of the products. The morphology and structure of the products were observed on scanning electron microscope (SEM, Sigma 500/VP, the accelerate voltage was 5 kV) and transmission electron microscope (TEM, JEM-100SX, the accelerate voltage was 200 kV). The photothermal effects of all samples and the IR thermal images were performed with an IR thermal camera (Fluke, Everett, WA). The laser equipment (STL650T1-1.0 W) in all experiments was obtained from Beijing Stone Boyuan Laser Technology Co., Ltd. The fluorescent images were captured by an inverted fluorescence microscopy (IX83, Olympus). The sonodynamic experiments were performed with an ultrasonic cleaning machine (40 kHz, 400 W, Kunshan Ultrasonic Instrument CO., Ltd).
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2

Multimodal Characterization of Graphene Quantum Dots

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The microstructure of the samples was studied using a high-resolution transmission electron microscope (TEM), JEM-2100F from JEOL Company, fortified with a 200 kV field emission gun. The elemental analysis was achieved by EDX, using an Oxford instrument 80 mm2 X-max detector system with point and ID mode. Raman Spectral analysis was conducted using the Micro Raman Confocal Microscope Witec Alpha300 model. Crystallinity and nature of synthesized GQDs were studied by an X-ray diffractometer 6100F from Shimadzu Company with a maximum power of 3 Kw, current of 30.0 mA, a divergent slit of 1.00 degree, scatter slit of 1.00, receiving slit of 0.3 mm with a scan range of 5–80 and a scan speed of 8 degrees per minute. The Fourier Transform Infrared spectra (FTIR) analysis was achieved using VERTEX 70v from Bruker Company with KBr as the reference. The optical structure was characterized by UV–Vis Spectroscopy using the Hitachi U-3900 UV spectrophotometer and a 10 mm path-length UV cell.
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