The morphology of the microparticles was determined using a Phillips XL 30 microscope. The Phillips XL 30 microscope was operated at a voltage of 5 kV. A small amount of powder was fixed onto an aluminum specimen holder with double-side tape and covered with gold.
Xl30 microscope
Manufactured by Philips
Sourced in United States, Netherlands
The Philips XL30 is a scanning electron microscope (SEM) that provides high-resolution imaging of samples. The XL30 uses a focused beam of electrons to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition.
Automatically generated - may contain errors
Lab products found in correlation
Em 208, by Philips (3 mentions)
S150a sputter coater, by Philips (2 mentions)
X pert mpd, by Philips (2 mentions)
Tristar 3000, by Micromeritics (2 mentions)
Delsa nanoc particle size analyzer, by Beckman Coulter (1 mentions)
Uv 2501 pc spectrometer, by Shimadzu (1 mentions)
Nicolet 5700, by Thermo Fisher Scientific (1 mentions)
D max 2500, by Rigaku (1 mentions)
Jem 2100 transmission electron microscope, by JEOL (1 mentions)
Tga q500, by TA Instruments (1 mentions)
Spectrum one, by PerkinElmer (1 mentions)
Nova 600 nanolab, by Thermo Fisher Scientific (1 mentions)
Su8000 electron microscope, by Hitachi (1 mentions)
Genesis edx system, by Thermo Fisher Scientific (1 mentions)
Sz 100, by Horiba (1 mentions)
Sputter coater, by Philips (1 mentions)
Leica em fc6, by Leica camera (1 mentions)
Zetasizer zs, by Malvern Panalytical (1 mentions)
Poly l lysine (pll), by Merck Group (1 mentions)
Zetasizer 3000, by Malvern Panalytical (1 mentions)
34 protocols using xl30 microscope
1
Microparticle Morphology Analysis via SEM
2
Visualizing Cellular Morphology on Silicon
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The physical characteristics of the silicon surfaces made it impossible to use standard microscopy to examine cellular morphology. To overcome this problem, we utilized Dil (1,1′-dioctadecyl-3,3,3′,3′-tetramethylindocarbocyanine perchlorate) staining and SEM.
Dil (Molecular Probes™; Thermo Fisher Scientific), a lipophilic dye that becomes fluorescent when incorporated into the cell membrane, was added (1 µg/mL) to the medium 40 minutes before cell fixation; after extensive washing with phosphate buffer, cells were fixed in 4% paraformaldehyde.
For SEM examination, cells were fixed in 2.5% glutaraldehyde in 0.2 M sodium cacodylate buffer at pH 7.4 and post-fixed in 2% OsO4 in 0.1 M sodium cacodylate buffer at pH 7.4, dehydrated in a graded ethanol series, and dried in hexamethyldisilazane. The samples were then sputter-coated with gold (Edwards S150A sputter coater) and observed under a XL30 Philips microscope. All reagents and grids for electron microscopy were from Electron Microscopy Sciences (Società Italiana Chimici, Rome, Italy).
Dil (Molecular Probes™; Thermo Fisher Scientific), a lipophilic dye that becomes fluorescent when incorporated into the cell membrane, was added (1 µg/mL) to the medium 40 minutes before cell fixation; after extensive washing with phosphate buffer, cells were fixed in 4% paraformaldehyde.
For SEM examination, cells were fixed in 2.5% glutaraldehyde in 0.2 M sodium cacodylate buffer at pH 7.4 and post-fixed in 2% OsO4 in 0.1 M sodium cacodylate buffer at pH 7.4, dehydrated in a graded ethanol series, and dried in hexamethyldisilazane. The samples were then sputter-coated with gold (Edwards S150A sputter coater) and observed under a XL30 Philips microscope. All reagents and grids for electron microscopy were from Electron Microscopy Sciences (Società Italiana Chimici, Rome, Italy).
3
Membrane Inset Preparation for Microscopy
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After experiments, membrane insets were carefully removed from their holding apparatus.
For light and transmission electron microscopy, the insets were fixed in a mixture of paraformaldehyde and glutaraldehyde in phosphate buffer 0.12M, post-fixed in osmium tetroxide 1% in cacodylate buffer 0.12M, dehydrated, and embedded in Epon-Araldite resin.
Semithin sections were cut perpendicular to the membrane, stained by toluidine blue, and observed by light microscopy.
Ultra-thin sections were then cut and placed on grids, stained by uranyl-acetate and lead-citrate, and observed under a CM10 Philips microscope (FEI, Eindhoven, The Netherlands).
For scanning electron microscopy, the insets were fixed in a mixture of glutaraldehyde 2% and paraformaldehyde 4% in phosphate buffer 0,12 M for 6 h, fixed in a mixture of osmium tetroxide 1% and sodium cacodylate buffer 0,12M for 2 h, dehydrated in a graded ethanol series and dried in hexamethyldisilazane. Then the pieces were sputter-coated with gold (Edwards S150A sputter coater) and observed under a XL30 Philips microscope. All reagents and grids for electron microscopy were from Electron Microscopy Sciences.
For light and transmission electron microscopy, the insets were fixed in a mixture of paraformaldehyde and glutaraldehyde in phosphate buffer 0.12M, post-fixed in osmium tetroxide 1% in cacodylate buffer 0.12M, dehydrated, and embedded in Epon-Araldite resin.
Semithin sections were cut perpendicular to the membrane, stained by toluidine blue, and observed by light microscopy.
Ultra-thin sections were then cut and placed on grids, stained by uranyl-acetate and lead-citrate, and observed under a CM10 Philips microscope (FEI, Eindhoven, The Netherlands).
For scanning electron microscopy, the insets were fixed in a mixture of glutaraldehyde 2% and paraformaldehyde 4% in phosphate buffer 0,12 M for 6 h, fixed in a mixture of osmium tetroxide 1% and sodium cacodylate buffer 0,12M for 2 h, dehydrated in a graded ethanol series and dried in hexamethyldisilazane. Then the pieces were sputter-coated with gold (Edwards S150A sputter coater) and observed under a XL30 Philips microscope. All reagents and grids for electron microscopy were from Electron Microscopy Sciences.
4
Characterization of Chitosan-Coated Iron Oxide Nanoparticles
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Transmission electron microscopy (TEM) images were obtained with a JEM-2100 transmission electron microscope (Jeol Ltd., Tokyo, Japan). X-ray diffraction (XRD) analysis was performed using a Dmax-2500 (Rigaku Corporation, Tokyo, Japan). Magnetic measurements (VSM) were studied using a vibrating sample magnetometer (Lake Shore Company, Westerville, OH, USA) at room temperature. Scanning electron microscopy (SEM) images were carried out on a Philips XL30 microscope (Amsterdam, The Netherlands). The zeta potential of these particles was measured by dynamic light scattering (DLS) with a Delsa™ NanoC Particle Size Analyzer (Beckman Coulter, Fullerton, CA, USA). Thermogravimetric analysis (TGA) of the nanocomposite and chitosan was performed in a TGA Q500 from TA Instruments (New Castle, DE, USA). Analyzed samples were heated from 100°C to 800°C at a heating rate of 10°C/min under a nitrogen flow of 50 mL/min. Fourier transform infrared spectroscopy (FTIR) of the nanocomposite and chitosan was performed by Nicolet 5700 (Thermo Nicolet, Waltham, MA, USA). The adsorption of BSA on CS-coated Fe3O4 NPs was measured using a UV-2501PC spectrometer (Shimadzu Corporation, Tokyo, Japan).
5
Morphology of ZnO Tetrapods from FTS
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The morphology of snowflake type material harvested from the FTS process was investigated by scanning electron microscope (Philips XL-30 microscope) equipped with LaB6 filament and energy dispersive X-ray diffraction analysis (EDAX) detector. SEM images were recorded at 10 kV acceleration voltage with 20 µA beam current at the University of Kiel. SEM investigations confirmed that this snowflake type material consists of tetrapod shaped ZnO structures. The thicknesses of the tetrapod arms vary from 200 nm to 2 µm. Their lengths are in the range from 500 nm to 50 µm. The crushed powder was also investigated inside SEM which confirmed that during crushing the arms of tetrapods are broken and thus forming 1D rods.
6
Multimodal Characterization of Porous Surfaces
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Scanning electron microscopy (SEM) micrographs were obtained using a Philips XL30 microscope working at a voltage of 25 kV. In order to improve the visualization, the porous surfaces were metallized with gold-palladium (80/20).
Information about the pore dimensions (average diameter and distribution) was obtained using the image analysis software (ImageJ, http://rsb.info.nih.gov/ij/).
The surface analysis by Confocal Raman Microscopy was performed using a WITec Alpha 300 RA (Ulm, Germany). This instrument uses a Nd:YAG laser (wavelength of 532 nm) and an output power of 10 mW output power. Moreover, two different gratings of 600 and 1800 grooves/line and a 100X objective (N.A: 0.95) were employed. This equipment is coupled to a piezoelectric stage that allows recording the images point by point with each 100 nm. Moreover, an optical fiber of 25 microns in diameter permits a spatial resolution less than 300 nm. To analyze the spectra and to make all the calculations and to build the Raman images, the software Witec Project Plus was employed.
ATR-FTIR spectra were recorded in a FTIR spectrometer Spectrum One of Perkin-Elmer.
Using ATR with and internal reflection elements diamond/ZnSe the region analyzed correspond to the 2m depth.
Information about the pore dimensions (average diameter and distribution) was obtained using the image analysis software (ImageJ, http://rsb.info.nih.gov/ij/).
The surface analysis by Confocal Raman Microscopy was performed using a WITec Alpha 300 RA (Ulm, Germany). This instrument uses a Nd:YAG laser (wavelength of 532 nm) and an output power of 10 mW output power. Moreover, two different gratings of 600 and 1800 grooves/line and a 100X objective (N.A: 0.95) were employed. This equipment is coupled to a piezoelectric stage that allows recording the images point by point with each 100 nm. Moreover, an optical fiber of 25 microns in diameter permits a spatial resolution less than 300 nm. To analyze the spectra and to make all the calculations and to build the Raman images, the software Witec Project Plus was employed.
ATR-FTIR spectra were recorded in a FTIR spectrometer Spectrum One of Perkin-Elmer.
Using ATR with and internal reflection elements diamond/ZnSe the region analyzed correspond to the 2m depth.
7
Characterization of Nanomaterials by SEM and EDX
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Scanning electron microscopic (SEM) imaging was performed using a Hitachi SU-8000 electron microscope (Hitachi High-Technologies Europe GmbH, Krefeld, Germany). Reflection electron microscope (REM) was performed in a Philips XL30 microscope (Philips, Eindhoven, The Netherlands) at 15 KeV and 21 µA. The samples were coated with 20–25 Å gold in an argon atmosphere.
For energy-dispersive X-ray (EDX) spectroscopy an EDAX Genesis EDX System attached to the scanning electron microscope (Nova 600 Nanolab, FEI, Eindhoven, The Netherlands) was used, using the operation mode 10 kV and a collection time of 30–45 s.
For energy-dispersive X-ray (EDX) spectroscopy an EDAX Genesis EDX System attached to the scanning electron microscope (Nova 600 Nanolab, FEI, Eindhoven, The Netherlands) was used, using the operation mode 10 kV and a collection time of 30–45 s.
8
Mineral Surface Characterization by SEM-EDX
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After the collection, samples were kept in distilled water, renewed every 24 h. Then an ascending sequence of alcohol dehydrated the samples which were fixed in stubs and metalized with palladium gold. Images were obtained in the Philips XL 30 microscope, operating at 15 Kv, with magnifications varying from 30× to 50,000×. The whole surface of the mineralizations was searched in order to choose the most representative sample areas.
Chemical analysis of the samples was performed using X-ray dispersive energy spectroscopy (EDX). The considered areas were smooth and compact, as well as irregular and porous. They were exactly the same as the ones chosen for image acquisitions. This way there was correspondence between SEM images and the EDX quantification.
Chemical analysis of the samples was performed using X-ray dispersive energy spectroscopy (EDX). The considered areas were smooth and compact, as well as irregular and porous. They were exactly the same as the ones chosen for image acquisitions. This way there was correspondence between SEM images and the EDX quantification.
9
Scanning Electron Microscopy Imaging
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Images of scanning electron microscopy (SEM) were attained in a Philips XL30 microscope (Amsterdam, The Netherlands). The samples were coated with a layer of 80:20 Au/Pd alloy and deposited in a holder before visualization.
10
Characterization of Synthesized Samples
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The as-synthesized samples
were characterized using XRD (Philips Xpert MPD Co., K-irradiation
1.78897 Å), SEM (Philips XL30 microscope, accelerating voltage
25 kV), and dynamic light scattering (DLS, Horiba SZ-100).
were characterized using XRD (Philips Xpert MPD Co., K-irradiation
1.78897 Å), SEM (Philips XL30 microscope, accelerating voltage
25 kV), and dynamic light scattering (DLS, Horiba SZ-100).
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