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Nova nanosem 50

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Nova NanoSEM 50 is a compact and versatile scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field emission gun (FEG) source, providing high-brightness electron beam for enhanced resolution and contrast. The system is equipped with a range of detectors, including secondary electron (SE), backscattered electron (BSE), and energy-dispersive X-ray (EDX) detectors, enabling comprehensive characterization of sample surfaces and compositions.

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4 protocols using nova nanosem 50

1

Cement Mortar Strength Testing Protocol

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SSCND at 90%, 80%, 70%, 60%, or 50% was premixed with 10%, 20%, 30%, 40%, or 50% of cement, respectively, for 30 s, according to GB/T17671-1999 “cement mortar strength testing method (ISO) made of cement mortar specimen”, followed by demolding after 24 h standard curing with the mold size of 20 mm × 20 mm × 20 mm, at 23 ± 1 °C and 90% humidity [32 (link)]. The specimen was continuously cured under standard conditions for 28 days.
The strength tests were conducted using an electrohydraulic servo pressure test machine under microcomputer control manufactured by Changchun New Testing Machine Co., LTD. (Changchun, China) The main technical parameters included (i) high vacuum mode at resolutions of 1.0 nm-15 kV (TLD-SE, FEI company, Hillsboro, OR, USA), 1.4 nm-1 kV (TLD-SE); (ii) low vacuum mode at resolutions of 1.5 nm-10 kV (HelixTM detector, FEI company, Hillsboro, OR, USA), 1.8 nm-3 kV (HelixTM detector), and (iii) landing voltage of 50~30 kV. The morphological observation was made using the Nova NanoSEM50 series of ultra-high resolution scanning electron microscopy produced by FEI company (Hillsboro, OR, USA). X-ray diffraction (XRD) analyses were performed with CuKα radiation under 40 kV and 100 mA and a scanning speed at 8°/min.
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2

Comprehensive Materials Characterization Protocol

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The morphologies were observed on scanning electron microscope (SEM, FEI Nova NanoSEM 50) with an accelerating voltage of 15 kV and field-emission transmission electron microscopy (TEM, FEI Tecnai G2 F30). Fourier transform infrared (FTIR) spectra were collected using Nicolet IS10 FTIR spectrometer. The Raman spectra were performed on Renishaw inVia Raman spectrometer with He–Ne laser excited at 632.8 nm. X-ray photoelectron spectroscopy (XPS) was conducted on Thermo ESCALAB 250Xi with Al Kα excitation radiation. X-ray diffraction patterns were carried out using a Bruker D8 advance device with a 1.54 Å Cu Kα radiation source. Differential scanning calorimetry (DSC) was performed by a DSC Q200 instrument, and thermogravimetric analysis (TGA) data were collected on a NETZSCH STA 449 F3 instrument with N2 atmosphere at a heating/cooling rate of 10 °C min−1. Tensile, flexural, and impact tests were tested on the Instron mechanical testing machine, according to the ISO527-1, ISO178, and ISO180 respectively. The friction and wear properties were evaluated on a universal tribotester (GMP-30, Jinan Hengxu Tribological Testing Technology Co. Ltd., China). Sliding was performed at ambient temperature for 2 h at a sliding speed of 0.419 m s−1 with a load of 196 N. Before each test, the steel ring and samples were all cleaned with acetone.
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3

Morphology and Composition Analysis of Samples

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Surface/cross-sectional morphologies of the samples were measured on a scanning electron microscope (SEM, FEI Nova NanoSEM 50). X-Ray Diffraction (XRD) patterns were recorded on a Smartlab X-ray diffractometer (Cu Kα, λ = 1.5406 Å, Rigaku, Japan). The samples were placed onto the silicon sample holder and sealed by polyimide film. Thermogravimetric (TG) curves were measured on a TG analyzer (NETZSCH, STA449F3 Jupiter). Compositions of the samples were investigated by FTIR spectroscopy (Perkin Elmer).
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4

Microstructural Analysis of Hydration Products

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X-ray diffraction (XRD, D8 Advance with CuKα, Bruker, Karlsruhe, Germany) was conducted to identify the crystalline phases present in the samples. Experiments were performed in the 2θ range between 5° and 80°. Fourier-transform infrared spectroscopy (FTIR, EQUINOX55, Bruker, Karlsruhe, Germany) was used to determine the chemical bonds and functional groups of the hydration products. The microstructure of these hydration products was analyzed by scanning electron microscopy (SEM, Nova NanoSEM-50, FEI Company, Hillsboro, OR, USA). The pore structures of the samples were analyzed by mercury intrusion porosimetry (MIP, AutoPore IV9500, McMurray Instruments, Atlanta, GA, USA).
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