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Eclipse lv 100nd

Manufactured by JEOL
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The Eclipse LV 100ND is a microscope system designed for routine observation and analysis of various samples. It features a compact and ergonomic design, enabling convenient usage in a laboratory environment. The system is equipped with a high-resolution optical system and offers basic functionalities for sample observation and imaging.

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Lab products found in correlation

Jsm 7500, by JEOL (1 mentions) Titan cube g2 60 300, by Thermo Fisher Scientific (1 mentions) Keithley 4200, by Tektronix (1 mentions) Lab ram aramis, by Veeco (1 mentions) Spex1403, by SPEX (1 mentions)

2 protocols using eclipse lv 100nd

1

Characterization of Copper Mesh Structure

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The morphology of the copper meshes was characterized using optical microscopy (Nikon eclipse LV 100ND) and scanning electron microscopy (SEM, JEOL JSM-7500). The thickness of the copper meshes was measured by atomic force microscopy (AFM). The X-ray diffraction (XRD) spectra were obtained on an Empyrean-2 diffractometer. The sheet resistance (RS) was measured using a four-point probe (ST2558B-F03) measurement, and the transparency of the conductive films was characterized using a UV-vis spectrophotometer (UV-9000). The mechanical properties of the copper meshes were measured via a bending test system.
Li L., Fan Q., Xue H., Zhang S., Wu S., He Z, & Wang J. (2020). Recrystallized ice-templated electroless plating for fabricating flexible transparent copper meshes. RSC Advances, 10(17), 9894-9901.
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2

Comprehensive Characterization of SLS MoS2 Nanosheets

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OM (Nikon ECLIPSE LV100ND), SEM(JEOL-6701F), Raman spectroscopy (HORIBA, Lab Ram ARAMIS; 532 nm laser excitation wavelength), AFM (VEECO, Multimode), PL (SPEX1403, SPEX; 532 nm laser excitation wavelength), XPS (Thermo U.K., K-alpha radiation), TEM (FEI Titan G2 Cube 60-300, accelerating voltage = 80 kV) and a voltage/current meter (Keithley 4200, Keithley Instruments) were all used in characterizing the SLS MoS2 nanosheets.
Kim Y., Song J.G., Park Y.J., Ryu G.H., Lee S.J., Kim J.S., Jeon P.J., Lee C.W., Woo W.J., Choi T., Jung H., Lee H.B., Myoung J.M., Im S., Lee Z., Ahn J.H., Park J, & Kim H. (2016). Self-Limiting Layer Synthesis of Transition Metal Dichalcogenides. Scientific Reports, 6, 18754.
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