Multimode nanoscope iiia
The Multimode Nanoscope IIIa is a high-resolution scanning probe microscope designed for advanced materials characterization. It employs atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to provide detailed topographical and structural information about a wide range of samples at the nanoscale level.
Lab products found in correlation
6 protocols using multimode nanoscope iiia
Tapping Mode AFM Characterization
Atomic Force Microscopy of Particles
Tapping Mode AFM for Polymer Film Analysis
Atomic Force Microscopy of SPMn Composites
Tapping Mode AFM Characterization of Solution-Cast Films
Atomic Force Microscopy of Fluid Samples
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