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Multimode nanoscope iiia

Manufactured by Digital Instruments
Sourced in United States

The Multimode Nanoscope IIIa is a high-resolution scanning probe microscope designed for advanced materials characterization. It employs atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques to provide detailed topographical and structural information about a wide range of samples at the nanoscale level.

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6 protocols using multimode nanoscope iiia

1

Tapping Mode AFM Characterization

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Atomic Force Microscopy was performed on a Digital Instruments Multimode Nanoscope IIIa, and a Digital Instruments Dimension 3100 Nanoscope IIIa. Phase and height images of solution‐cast films were recorded in the tapping mode regime in air at room temperature using silicon cantilever tips (PPP‐NCHR). Images were processed using Gwyddion software (version 2.43), and the root mean square roughness was extracted from 1 × 1 μm height images.
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2

Atomic Force Microscopy of Particles

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AFM measurements is carried out in tapping mode in free air at room temperature (25 °C) with a Multimode NanoScope IIIa (Digital Instruments, Santa Barbara, CA, USA). Typically, 4 µL of particles’ dispersion in water is deposited on fresh mica cleaved by pressing an adhesive tape against the top mica surface and peeling off the tape. The sample on the mica surface is dried under nitrogen flow for a few minutes before imaging.
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3

Tapping Mode AFM for Polymer Film Analysis

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A Digital Instruments Multimode Nanoscope IIIa, operating in the tapping mode regime, was used to record phase and height images of solution‐cast films at room temperature with silicon cantilever tips (PPP‐NCHR, NanoSensorstm, 204–497 kHz, 10–130 N/m). Images were processed using Gwyddion software (version 2.43). Polymer film hydrophobicity was determined by water contact angle analysis. A 4 μl water droplet was deposited on the polymer surface, images were taken at 5 s after droplet deposition and contact angles were measured with contact angle system OCA and SCA 202 v4.1.13 build 1020 software (Dataphysics Intruments, Germany). Two droplets per sample were deposited over 3 replicates.
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4

Atomic Force Microscopy of SPMn Composites

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The SPMn composite were further investigated using a Multimode Nanoscope IIIa atomic force microscope (AFM, Digital Instruments, USA). The images were acquired in tapping mode in air at room temperature using a Si tip cantilever (Veeco Nanoprobe Tips RTESPA model) with a resonance frequency of 275-300 kHz. Height-and amplitude-mode images were recorded simultaneously with 1.0 Hz scan rate. Processing and analysis of the images were carried out using the off-line software Nanoscope V614r1. The sample for AFM was prepared by depositing a dilute dispersion on a freshly cleaved mica (Ted Pella, Highest Grade V1) and were left to dry at room temperature.
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5

Tapping Mode AFM Characterization of Solution-Cast Films

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A Digital Instruments Multimode Nanoscope IIIa, operating in the tapping mode regime, was used to record phase and height images of solution-cast films at room temperature with silicon cantilever tips (PPP-NCHR, NanoSensors tm , 204-497 kHz, 10-130 N/m). Images were processed using Gwyddion software (version 2.43). Fiber thickness was measured from phase images in ImageJ (version 1.48v, National Institutes of Health, USA).
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6

Atomic Force Microscopy of Fluid Samples

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The AFM used in the experiment was a Multimode Nanoscope IIIa from Digital Instruments (Bruker AXS GmbH), equipped with a liquid cell and an O-ring which sealed the cell and the substrate to prevent liquid leakage during the measurement. During the scanning, a vertical engage J scanner (120 × 120 μm 2 ) and silicon nitride cantilevers with their spring constant around 0.32 N/m were used. The probes were cleaned by immersing them in acetone and ethanol, respectively, and then rinsed with water. For imaging in fluid, the resonance frequency in tapping mode was from 7 kHz to 12 kHz and the amplitude set point was 80-90% of the free amplitude.
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