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Labram hr ev0

Manufactured by Horiba
Sourced in France

The LabRAM HR EVO is a high-resolution Raman spectrometer designed for advanced materials analysis. It features a compact and modular design, allowing for customization to suit various research and industrial applications. The core function of the LabRAM HR EVO is to provide high-quality Raman spectroscopy data for the characterization of materials.

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2 protocols using labram hr ev0

1

Comprehensive Material Characterization Protocol

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Powder X-Ray diffraction (XRD) patterns (Empyrean, Panalytical, Malvern, UK) were used to characterize the crystal structure and phase composition. Raman spectra were measured on a laser micro-Raman spectrometer (LabRAM HR EV0, Horiba Jobin Yvon, Paris, France) using a 532 nm excitation laser. X-ray photoelectron spectroscopy (XPS) measurements were done with a spectrometer (ESCALAB 250Xi, Thermo Scientific Escalab, Waltham, MA, USA). The morphology of the materials was observed by field-emission scanning electron microscopy (SEM, Carl Zeiss, Merlin Compact, Jena, Germany), and TEM and HRTEM images were obtained on a Tecnai TEM G2 microscope (Waltham, MA, USA). The optical properties of samples were obtained from the UV-vis diffuse reflectance spectrum (Shimadzu UV1700, Shimane, Japan) and photoluminescence spectrum, with an excitation source at 532 nm wavelength.
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2

Comprehensive Material Characterization Techniques

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The morphology and crystallinity of the obtained material were performed by scanning electron microscopy (SEM, Carl Zeiss, Merlin Compact, Jena, Germany). The transmission electron microscope (TEM, FEI, Hillsboro, USA) and high-resolution TEM (HRTEM, FEI, Hillsboro, USA) observations were performed with a TEI Tecnai G2 F30 (FEI, Hillsboro, USA) microscope operating at 300 KV, while energy-dispersive X-ray spectroscopy (EDS) and elemental mapping were performed on the transmission electron microscope. On the spectrometer (ESCALAB 250Xi, Thermo Scientific Escalab, Waltham, USA), the X-ray photoelectron spectroscopy (XPS) measurement was carried out. The X-ray power diffraction (XRD) analysis was characterized by an X-ray diffractometer (Empyrean, Panalytical, Malvern, UK) equipped with Cu Kα radiation (λ = 1.5418 Å). Raman spectra were obtained using a 532.8 nm excitation laser on the LabRAM HR EV0 of Horiba Jobin Yvon, Langjoux, France. The optical response of all the samples was obtained by photoluminescence (PL) measurements excited by a 325 nm He-Cd laser. At room temperature, the ultraviolet visible diffuse reflectance spectra (DRS) was recorded on the Shimadzu UV1700-visible spectrophotometer.
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