The micromorphological characteristics of the biochar and ACs were determined by scanning electron microscopy and energy dispersive X-ray spectrometry (SEM–EDX; IT-500HR JEOL) and high-resolution transmission electron microscopy (HRTEM; JEOL-JEM-3100F) with an accelerating voltage of 300 kV. The qualitative functional groups presented on the surface of all ACs were characterized by Fourier-transform infrared spectroscopy (FTIR; FT/IT-6800 JASCO). The textural properties of the ACs, including the specific surface area and pore size distribution, were computed by N2 adsorption/desorption isotherms at 77 K using a Multipoint Surface Area Analyzer (Micromeritics, Tristar II3020) coupled with the classical adsorption theories of Brunauer–Emmett–Teller (BET) methods.
Jem 3100f
Manufactured by JEOL
Sourced in Japan
The JEM-3100F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of samples at the nanoscale level. The JEM-3100F utilizes a field emission gun to generate a high-brightness electron beam, enabling the microscope to achieve a high resolution and low-voltage imaging capabilities.
Automatically generated - may contain errors
Lab products found in correlation
Tristar 2 3020, by Micromeritics (2 mentions)
It 500hr, by JEOL (1 mentions)
Ft it 6800, by Jasco (1 mentions)
Nicole is50, by Thermo Fisher Scientific (1 mentions)
Mini x, by Microtrac (1 mentions)
Ultrospec 2100 biochrom spectrophotometer, by Harvard Bioscience (1 mentions)
Perkin elmer ftir spectrophotometer, by PerkinElmer (1 mentions)
Jsm it500hr, by JEOL (1 mentions)
Lambda 950, by PerkinElmer (1 mentions)
D2 phaser, by Bruker (1 mentions)
Jed 2300, by JEOL (1 mentions)
Zetasizer ultra, by Malvern Panalytical (1 mentions)
D8 advance, by Bruker (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Esca 3400, by Shimadzu (1 mentions)
X pert pro mpd diffractometer, by Malvern Panalytical (1 mentions)
10 protocols using jem 3100f
1
Comprehensive Characterization of Biochar and ACs
2
Comprehensive Characterization of Hemp Stem-Derived Activated Carbons
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The amounts of carbon, hydrogen, and nitrogen of the hemp stem and the obtained activated carbons (ACs) were characterized by CHN analysis (CHNS/O analyzer 628 series, Leco Corporation, USA). The porous textures of the samples were determined by N2 sorption measurements at − 196 °C (BELsorp MiniX). The specific surface area was calculated using the Brunauer–Emmett–Teller method (SBET). Total pore volume was estimated from the N2 adsorption amount at a relative pressure of 0.99 (Vtotal). The micropore volume was calculated using the Dubinin–Radushkevich (DR) equation (Vmicro)24 . The obtained ACs were also characterized by Fourier transform infrared spectroscopy (FTIR, Nicole iS50, Thermo Fisher Scientific) in transmission mode (2.5 wt% in KBr). The number of scans and resolution were 16 and 4, respectively. X-ray photoelectron spectroscopy (XPS) measurements were performed using a Kratos AXIS NOVA instrument (Shimadzu Co.). The charge-up shift correction was conducted by setting the C 1s binding energy level of the samples to 284.5 eV. The ACs were also subjected to transmission electron microscopy (TEM, JEOL: JEM 3100F) to investigate pore structure and morphology of the samples.
3
Scanning and Transmission Electron Microscopy
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The surface morphology was observed by field emission scanning electron microscope (FEI, model Versa). The samples were sprinkled on a carbon tape located on steel sample holder and coated by gold sputtering to enhance electron conductivity for identification. TEM images of the materials were obtained using a JEOL JEM-3100F transmission electron microscope, operated at an acceleration voltage of 300 kV. The sample dispersed in ethanol was dropped onto the Cu grid (200 square mesh coated with carbon film) and dried at room temperature overnight prior to measurements [29 (link)].
4
Characterization of AgNPs and Bionanocomposite
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AgNPs and L. sativum oil/PEG/Ag-MgO bionanocomposite have been characterized by using spectroscopic techniques such as ultraviolet–visible (UV–vis), Fourier transform infrared (FTIR), and X-ray diffraction (XRD). UV–vis spectra of green synthesized AgNPs and Ag-MgO/L. sativum oil bionanocomposite have been carried out on Ultrospec 2100-Biochrom spectrophotometer, (Biochrom Ltd, Cambium, Cambridge, UK). FT-IR of the pre-synthesized nanoparticles and bionanocomposite spectra have been recorded on a PerkinElmer FT-IR spectrophotometer (PerkinElmer Ltd, Yokohama, Japan). XRD measurements of biosynthesized samples were performed on EMPREAN PAN analytical diffractometer (Malvern Panalytical B.V., Eindhoven, Netherlands) employed with a Cu-Kα (λ = 1.5406 Å) radiation source. The morphology and size of AgNPs and bionanocomposites were studied using scanning electron microscopy (SEM, JSM-6390LV, JOEL Ltd, USA) and transmission electron microscope (TEM, JEM-3100F, JEOL Ltd, USA). Energy-dispersive X-ray spectroscopy (EDX, RONTEC’s EDX system, Model QuanTax 200, Germany) was performed to evaluate the components of the biosynthesized samples.
5
Characterization of Au-decorated Semiconductors
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The light absorption
capacity and the diffuse reflectance spectra over the wavelength range
of 300–800 nm were measured by ultraviolet–visible–near-infrared
spectrophotometry (UV–vis; Lambda 950, PerkinElmer). The crystallite
structure of all semiconductors was analyzed by X-ray diffractometry
(XRD; D2 Phaser, Bruker). The surface morphology and chemical composition
of the fresh semiconductors and Au-decorated semiconductors were primarily
observed via scanning electron microscopy (SEM; JSM-IT-500HR, JEOL)
with energy-dispersive X-ray spectrometry (EDX; JED-2300, JEOL) and
high-resolution transmission electron microscopy (HRTEM; JEM-3100F,
JEOL) with an accelerating voltage of 300 kV. The surface area, average
pore size, and total pore volume were examined using a Multipoint
Surface Area Analyzer (Tristar II3020, Micromeritics) via the Brunauer–Emmett–Teller
(BET) method. The bonding and chemical state of the elements were
determined with an X-ray photoelectron spectrometer (XPS; Axis Supra,
Kratos, U.K.) with a Delay Line detector (DLD) and a monochromatic
Al Kα (hν = 1486.6 eV) source. Accurate
binding energies (±0.1 eV) were established with respect to the
position of the adventitious carbon C 1s peak at 284.8 eV.
capacity and the diffuse reflectance spectra over the wavelength range
of 300–800 nm were measured by ultraviolet–visible–near-infrared
spectrophotometry (UV–vis; Lambda 950, PerkinElmer). The crystallite
structure of all semiconductors was analyzed by X-ray diffractometry
(XRD; D2 Phaser, Bruker). The surface morphology and chemical composition
of the fresh semiconductors and Au-decorated semiconductors were primarily
observed via scanning electron microscopy (SEM; JSM-IT-500HR, JEOL)
with energy-dispersive X-ray spectrometry (EDX; JED-2300, JEOL) and
high-resolution transmission electron microscopy (HRTEM; JEM-3100F,
JEOL) with an accelerating voltage of 300 kV. The surface area, average
pore size, and total pore volume were examined using a Multipoint
Surface Area Analyzer (Tristar II3020, Micromeritics) via the Brunauer–Emmett–Teller
(BET) method. The bonding and chemical state of the elements were
determined with an X-ray photoelectron spectrometer (XPS; Axis Supra,
Kratos, U.K.) with a Delay Line detector (DLD) and a monochromatic
Al Kα (hν = 1486.6 eV) source. Accurate
binding energies (±0.1 eV) were established with respect to the
position of the adventitious carbon C 1s peak at 284.8 eV.
6
Characterization of Silver Nanoparticles
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The particle size of silver nanoparticles was evaluated by a field-emission transmission electron microscope (FE-TEM, JEM-3100F, JEOL, Tokyo, Japan) operated at a voltage of 300 kV. The particle size distribution and average diameters of silver nanoparticles were determined by analyzing 100 particles from the TEM images using ImageJ software (NIH). Zeta potential of the colloidal particles was evaluated by zeta potential analyzer (Zetasizer Ultra, Malvern Instruments Ltd., Worcestershire, UK).
7
Multimodal Characterization of Cu-Ni Catalysts
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XRD
patterns were obtained by an X-ray diffractometer (XRD: Bruker D8
ADVANCE) with Cu Kα radiation (λ = 1.54 Å) at 40
kV and 30 mA in the 2θ range from 5° to 90°. Nitrogen
physisorption measurements were obtained at −196 °C using
a Quantachrome Autosorb-1C analyzer to determine the specific surface
area. The pore size distribution was evaluated by BET and Barrett–Joyner–Halenda
methods. The amounts of loaded Cu–Ni metals were measured by
ICP–OES, (Aligent 700-ES series). XPS analysis was conducted
with monochromatic Al Kα radiation (hυ
= 1486.6 eV) on AXIS Ultra DLD (Kratos Analytical Ltd.), in order
to analyze the surface chemical compositions. The surface morphology
of the samples was assessed by a field-emission scanning electron
microscope (FE-SEM: JEOL, JSM-7600F), operating at 5 kV with Pt-coating
of the sample (thickness of ca. 2 nm). The nanostructure of the samples
was observed by a transmission electron microscope (TEM; JEOL JEM-3100F)
operating at 300 kV. Note that, the samples were prepared by dispersion
in ethanol solution through sonication and then coated on copper grids
having 200 mesh.
patterns were obtained by an X-ray diffractometer (XRD: Bruker D8
ADVANCE) with Cu Kα radiation (λ = 1.54 Å) at 40
kV and 30 mA in the 2θ range from 5° to 90°. Nitrogen
physisorption measurements were obtained at −196 °C using
a Quantachrome Autosorb-1C analyzer to determine the specific surface
area. The pore size distribution was evaluated by BET and Barrett–Joyner–Halenda
methods. The amounts of loaded Cu–Ni metals were measured by
ICP–OES, (Aligent 700-ES series). XPS analysis was conducted
with monochromatic Al Kα radiation (hυ
= 1486.6 eV) on AXIS Ultra DLD (Kratos Analytical Ltd.), in order
to analyze the surface chemical compositions. The surface morphology
of the samples was assessed by a field-emission scanning electron
microscope (FE-SEM: JEOL, JSM-7600F), operating at 5 kV with Pt-coating
of the sample (thickness of ca. 2 nm). The nanostructure of the samples
was observed by a transmission electron microscope (TEM; JEOL JEM-3100F)
operating at 300 kV. Note that, the samples were prepared by dispersion
in ethanol solution through sonication and then coated on copper grids
having 200 mesh.
8
Surface Characterization of Ag-BDD Electrodes
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An FESEM (JEOL, JEM-3100F) was used to analyse the surface morphology of the Ag-BDDL electrodes. Energy-dispersive X-ray spectroscopy was conducted for elemental mapping of the Ag nanoparticle-modified BDDL substrates. Elemental states of Ag-BDDL electrodes before and after photoelectrochemical reaction at −1.1 V for 5 h were determined with an X-ray photoelectron spectrometer (ESCA-3400, Shimadzu) using a monochromatic Mg Kα source.
9
Transfersomal Formulation Visualization
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A drop of the selected transfersomal formulation (MF8) was placed on a carbon coated copper grid for 2 min, adsorbed with filter paper and then negatively stained by phosphotungstic acid. The air-dried sample was visualized under the transmission electron microscope at 10-100 K magnification at an accelerating voltage of 300 kV (JEOL JEM-3100F, Munchen, Germany).
10
Comprehensive Material Characterization Protocol
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We performed X-ray diffraction (XRD) structural analysis using a PANalytical X’pert Pro MPD diffractometer equipped with a Cu–Kα radiation source (wavelength Kα1 = 1.540598 Å and Kα2 = 1.544426 Å) operated at 40 kV and 30 mA and a scan rate of 0.03° 2θ s−1 over a 2θ range of 5°–80°. Field emission scanning electron microscopy (FESEM) was performed using a SUPRA 40VP unit (Carl Zeiss, Germany) equipped with X-ray energy-dispersive spectrometry (EDS). Transmission electron microscopy (TEM; Jeol JEM-3100F, Tokyo, Japan, at 200 kV) was performed by placing a drop of a sample suspension in ethanol on a standard carbon-coated copper grid. X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, Waltham, MA, USA) using a monochromatic Al–Kα X-ray source (hν = 1486.6 eV) was used for elemental quantification and to study valence states.
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