Nx10 atomic force microscope
The NX10 Atomic Force Microscope is a high-resolution imaging and measurement device that uses a sharp probe to scan the surface of a sample. It provides nanoscale topographical and property information about the sample's surface.
Lab products found in correlation
8 protocols using nx10 atomic force microscope
Characterization of Cellulose Nanocomposites
Atomic Force Microscopy of Aqueous Samples
Atomic Force Microscopy Imaging of Surface Deposits
Visualizing Amyloid Fibril Morphology
TEM and AFM. For the TEM analysis, fibrils were diluted to 5–10
μM and incubated on carbon-coated copper grids for 3–4
min before washing with distilled water (dH2O) and staining
with uranyl acetate (2% w/v) for 2 min and then washed again with
dH2O. TEM images were taken on a Tecnai G2 80-200kv transmission
electron microscope (ThermoScientific, at the Cambridge Advanced Imaging
Centre (CAIC), University of Cambridge) with magnifications of 9–14
k. ImageJ was used for length analysis. The same protocol was applied
to protofibrils, and they were imaged on a Talos F200X G2 TEM (ThermoScientific,
Dept. of Chemistry, University of Cambridge).
AFM samples were
prepared following a method previously described (Flagmeier et al.,44 (link)). Fibrils were diluted to 1 μM in dH2O, and 50 μL was deposited onto freshly cleaved mica
and incubated for 45 min before washing with 50 μL of dH2O. All samples were imaged on a NX10 Atomic Force Microscope
(Park Systems, Suwon, South Korea) using non-contact mode. Areas of
4 μm × 4 μm were imaged in 1024 pixels at a speed
of 0.3–0.4 Hz. Images were analyzed by SPIP software (Image
Metrology, Hørsholm, Denmark) to determine the height and length
of aggregates.
Biofilm Visualization via AFM Imaging
Atomic Force Microscopy of Mycobacteria
Nanoscale Imaging of Biological Fibrils
To compare the height of different samples consistently, we established standardized experimental scanning conditions, and we maintained a regime of phase change on the order of ≈∆20° [97, 100] . Raw images were flattened with XEI software (Park System, South Korea), and statistical analysis was performed by SPIP (Image Metrology, Denmark).
AFM Analysis of Carbon Nanofiber Topography
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