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Nx10 atomic force microscope

Manufactured by Park Systems

The NX10 Atomic Force Microscope is a high-resolution imaging and measurement device that uses a sharp probe to scan the surface of a sample. It provides nanoscale topographical and property information about the sample's surface.

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8 protocols using nx10 atomic force microscope

1

Characterization of Cellulose Nanocomposites

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The morphological characterization was done by XRD (Bruker D8 Advance X-ray diffractometer) with Cu-Kα radiation (λ = 1.54 Å). The surface morphology of the cellulose microfibrils and the cellulose/PDMS nanocomposite was carried out by field emission scanning electron microscope (Supra 55 Zeiss). The surface morphology of the gold nanoparticles was carried out by high resolution transmission electron microscopy (JEOL, JEM – 2100). Fourier transform-infra red spectroscopy measurement was carried out by FT-IR Bruker Tensor 27 spectrophotometer. The ultraviolet-visible spectroscopy measurement was carried out by UV-visible Agilent Cary-60 UV-vis spectrophotometer. The dielectric constant vs. frequency characteristics is measured by NF ZM2376 LCR Meter. The open circuit voltage signals and the short circuit current signals were measured using a digital storage oscilloscope (Scientific SMO502). The d33 measurements were carried out by SIN0CERA YE2730A d33 Meter. The PFM measurements were carried out by Park Systems NX10 Atomic Force Microscope. The stress vs. strain characteristics were measured by Anton Paar Physica MCR 301 rheometer.
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2

Atomic Force Microscopy of Aqueous Samples

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Aqueous samples (5 μL of concentration 2.5 μL/mL) were sonicated, drop deposited on freshly cleaved mica and dried over in vacuum at 30 °C for 20 min. The samples were maintained in desiccator until analysis. Topography images were obtained in a NX-10 Atomic Force Microscope (Park Systems, Suwon, South Korea) in an acrylic glove box with controlled temperature (around 22 °C) and humidity (around 3%). AFM imaging was acquired at tapping mode using a NCHR probe (NanoWorld) with a spring constant of 42 N/m and 320 kHz resonance frequency. The imaging was obtained with a scan speed of 0.5 Hz with a scanning resolution of 512 × 512 points. For each sample, at least 10 images were collected. Image measurements and automatic processing (plane subtraction and rows alignment) were performed using Gwyddion 2.47 software (http://gwyddion.net/).
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3

Atomic Force Microscopy Imaging of Surface Deposits

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We performed in air AFM measurements of the sample deposited on glass, where TIRF measurements had been acquired. High-resolution images (1,024 × 1,024 pixels) and phase-controlled maps (26 (link)) were collected using an NX10 Atomic Force Microscope (Park Systems) under ambient conditions and in amplitude modulation noncontact (NC-AM) mode. We imaged square areas of 2 × 2 µm and 4 × 4 µm. We performed all of the measurements using sharp cantilevers (PPP-NCHR; Park Systems) with resonance frequency of 330 kHz and a typical apical radius of 8 nm. The raw images were flattened using the built-in software (XEI; Park Systems). To maintain consistency in the subsequent statistical analysis, all images were processed using the same parameters. The images were first flattened by a plane and then line-by-line in first regression order. This second step was repeated until a flat baseline in the line profile of the image was reached. During the process of flattening of the images, the aggregates were masked from the calculation to avoid modification and underestimation of their heights.
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4

Visualizing Amyloid Fibril Morphology

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Fibril morphology was analyzed by
TEM and AFM. For the TEM analysis, fibrils were diluted to 5–10
μM and incubated on carbon-coated copper grids for 3–4
min before washing with distilled water (dH2O) and staining
with uranyl acetate (2% w/v) for 2 min and then washed again with
dH2O. TEM images were taken on a Tecnai G2 80-200kv transmission
electron microscope (ThermoScientific, at the Cambridge Advanced Imaging
Centre (CAIC), University of Cambridge) with magnifications of 9–14
k. ImageJ was used for length analysis. The same protocol was applied
to protofibrils, and they were imaged on a Talos F200X G2 TEM (ThermoScientific,
Dept. of Chemistry, University of Cambridge).
AFM samples were
prepared following a method previously described (Flagmeier et al.,44 (link)). Fibrils were diluted to 1 μM in dH2O, and 50 μL was deposited onto freshly cleaved mica
and incubated for 45 min before washing with 50 μL of dH2O. All samples were imaged on a NX10 Atomic Force Microscope
(Park Systems, Suwon, South Korea) using non-contact mode. Areas of
4 μm × 4 μm were imaged in 1024 pixels at a speed
of 0.3–0.4 Hz. Images were analyzed by SPIP software (Image
Metrology, Hørsholm, Denmark) to determine the height and length
of aggregates.
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5

Biofilm Visualization via AFM Imaging

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The biofilm samples were collected using a sterile glass piece and dried in a desiccator and visualized using NX-10 Atomic force microscope, Park Systems under non-contact mode.
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6

Atomic Force Microscopy of Mycobacteria

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The cultures used for AFM were grown to mid-log phase in Middlebrook 7H9 medium containing 10% OADC and prepared as previously described [28 (link)]. Samples were centrifuged at 4500 rpm for 5 min, followed by 3 washes with sterile milliQ water to remove residual media components. The OD600 was set to 0.1, and 100μl of the sample was added onto poly-L-lysine coated coverslips. The samples were then air-dried at room temperature for an hour, and the non-adherent bacteria were washed off with multiple washes of sterile milliQ water; the coverslips were air-dried for an hour again and mounted onto the magnetic stub of the AFM stage using double-sided carbon tape. All the AFM measurements were performed using the NX-10 Atomic Force Microscope (Park Systems, South Korea) in the non-contact mode. A silicon probe tip with a high-force constant was used at a resonating frequency of 300kHz. The cantilever had a pyramid-shaped tip with a radius less than 10μm, width of 35μm, length of 125μm, and thickness of 4.5μm.
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7

Nanoscale Imaging of Biological Fibrils

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The samples were prepared for atomic force microscopy (AFM) to measure the fibrillar crosssectional diameter (height) and length, as well as the width of associated fibrils. High-resolution images (1024x1024 and 2048x2048 pixels) were collected using an NX10 atomic force microscope (Park Systems, South Korea) under ambient conditions and in noncontact amplitude modulation (NC-AM) [97] . We imaged square areas of 2x2 µm 2 and 4x4 µm 2 . We performed all the measurements using ultrasharp cantilevers (SSS-NCHR, Park Systems, South Korea) with a resonance frequency of 330 kHz and a typical radius of curvature of 2 nm.
To compare the height of different samples consistently, we established standardized experimental scanning conditions, and we maintained a regime of phase change on the order of ≈∆20° [97, 100] . Raw images were flattened with XEI software (Park System, South Korea), and statistical analysis was performed by SPIP (Image Metrology, Denmark).
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8

AFM Analysis of Carbon Nanofiber Topography

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Topography, electric potential, and capacitance gradient (dC/dz) images of the CNFs were recorded with the Nx-10 Atomic Force Microscope (Park systems, Suwon, Korea). For the analysis, 1.5 mL of the CNF suspension was placed on a grid with mica surface and dried at room temperature. The digital images were acquired with a microscope equipped with a camera, under controlled parameters (relative humidity 10% RH and temperature ¼ 25 C). The electric potential and the capacitance were measured (Kelvin probe force microscopy -KPFM) according to the procedures described by Ferreira et al. (2015) , by applying a second AC signal at 5 V to the metal-coated cantilever. The dC/dZ signal is a qualitative measure that is acquired with the third locking (signal amplitude) tuned in the second harmonic of the electric signal (AC) applied to the probe. The AFM analyses were conducted at the Laboratory for Surface Science (LCS) of the National Nanotechnology Laboratory (LNNano) (Campinas, Brazil). The nanofiber morphology and diameter were determined by image analysis with the aid of the Gwiddion software.
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