Tof sims 5 spectrometer

Manufactured by ION-TOF

Sourced in Germany

The ToF-SIMS V spectrometer is a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument designed for surface analysis. It utilizes a pulsed primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by a time-of-flight mass analyzer to determine the chemical composition and structure of the sample.

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Lab products found in correlation

Jem 2100, by JEOL (1 mentions) Jsm 6700f, by JEOL (1 mentions)

6 protocols using tof sims 5 spectrometer

XPS and ToF-SIMS Analysis of Polymer Surfaces

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The XPS spectra were taken on a Surface Science Instruments S-probe spectrometer. X-ray spot size for these acquisitions was ∼800 m. Pass energy for survey spectra was 150 eV and pass energy for high-resolution scans was 50 eV. The Service Physics Hawk Data Analysis Software was used to determine peak areas, to calculate the elemental compositions from peak areas above a linear background and to peak fit the high-resolution spectra. The binding energy scales of the high-resolution spectra were calibrated by assigning the lowest binding energy peak a binding energy of 285.0 eV.
ToF-SIMS images were acquired on a ToF-SIMS 5 spectrometer (IonToF) using a 25 keV Bi₃+ cluster ion source in the pulsed mode. The ion source was operated with a current of ∼0.07 pA at the surface. Secondary ions of a given polarity were extracted and detected using a reflectron time-of-flight mass analyser. Positive ion images were calibrated using the CH3⁺, C2H3⁺, C3H5⁺ and C7H7⁺peaks. The negative ion images were calibrated using the CH⁻, OH⁻, C2H⁻ and C4H⁻ peaks. PEG-related peaks were characterized as C2H5O, C3H3O, C3H7O, C4H7O2 and C4H9O2, whereas TCPS-related peaks were characterized as C4H9, C7H7, C8H9 and C9H7.

Ma Z., Wang J., Loskill P., Huebsch N., Koo S., Svedlund F.L., Marks N.C., Hua E.W., Grigoropoulos C.P., Conklin B.R, & Healy K.E. (2015). Self-organizing human cardiac microchambers mediated by geometric confinement. Nature Communications, 6, 7413.

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XPS and ToF-SIMS Analysis of Polymer Surfaces

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The XPS spectra were taken on a Surface Science Instruments S-probe spectrometer. X-ray spot size for these acquisitions was approximately 800 m. Pass energy for survey spectra was 150 eV and pass energy for high resolution scans was 50 eV. The Service Physics Hawk Data Analysis Software was used to determine peak areas, to calculate the elemental compositions from peak areas above a linear background, and to peak fit the high-resolution spectra. The binding energy scales of the high-resolution spectra were calibrated by assigning the lowest binding energy peak a binding energy of 285.0 eV.
ToF-SIMS images were acquired on a ToF-SIMS 5 spectrometer (IonToF) using a 25 keV Bi₃+ cluster ion source in the pulsed mode. The ion source was operated with a current of ~0.07 pA at the surface. Secondary ions of a given polarity were extracted and detected using a reflectron time-of-flight mass analyzer. Positive ion images were calibrated using the CH3⁺, C2H3⁺, C3H5⁺, and C7H7⁺peaks. The negative ion images were calibrated using the CH⁻, OH⁻, C2H⁻, and C4H⁻ peaks. PEG related peaks were characterized as C2H5O, C3H3O, C3H7O, C4H7O2 and C4H9O2, whereas TCPS related peaks were characterized as C4H9, C7H7, C8H9 and C9H7.

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ToF-SIMS Analysis of PPAm Coating

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The static ToF-SIMS spectra of PPAm coating was determined by using a ToF-SIMS V spectrometer (ION-TOF GmbH, Münster, Germany). Sample was bombarded by 25 kV Bi₃⁺ primary ions with a pulsed current of 0.75 pA. The analysis area was 200 μm × 200 μm, and the acquisition time was fixed to 40 s. Thus, an ion dose was less than 3 × 10¹¹ ions cm⁻², well below the static limit of SIMS conditions. A low-energy flood gun was used to realize Charge compensation, and three measurements at different locations were performed for each specimen. The spectra were corrected prior to extracting ionic strength data using IonSpec software.

Yang T., Du Z., Qiu H., Gao P., Zhao X., Wang H., Tu Q., Xiong K., Huang N, & Yang Z. (2020). From surface to bulk modification: Plasma polymerization of amine-bearing coating by synergic strategy of biomolecule grafting and nitric oxide loading. Bioactive Materials, 5(1), 17-25.

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Characterization of Xerogels and Hydrogels

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The morphology and distribution of CNS were characterized by transmission electron microscopy (JEOL, JEM-2100, 200 kV), equipped with an energy dispersive spectroscopy system. The structure of the xerogels was characterized by a high-resolution scanning electron microscope (JEOL, model JSM-6700F). The T_g of the hydrogels were determined by a differential scanning calorimeter (TA Q1000). ToF-SIMS was used to demonstrate the existence of the PAM end and side groups, and CNS. Static ToF-SIMS spectra of pure PAM and NC gel C200 were obtained from a ToF-SIMS V spectrometer (ION-TOF GmbH, Münster, Germany). The samples were bombarded with Bi₃⁺ primary ions, which were accelerated at 25 kV with an average pulsed current of 0.3 pA. The raster area was 200 × 200 μm, and the acquisition time for each spectrum was 40 s, corresponding to an ion dose of <4 × 10¹¹ ions per cm². Three positive and negative spectra were recorded for each specimen at different locations.

Sun G., Li Z., Liang R., Weng L.T, & Zhang L. (2016). Super stretchable hydrogel achieved by non-aggregated spherulites with diameters <5 nm. Nature Communications, 7, 12095.

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Time-of-Flight Secondary Ion Mass Spectrometry Protocol

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Time-of-flight secondary ion mass spectrometry data were acquired using a TOF.SIMS V spectrometer (ION-TOF GmbH, Muenster, Germany). The analysis chamber was maintained at less than 5 × 10⁻⁷ Pa under operational conditions. The total primary ion flux was less than 10¹² ions cm^-2 ensuring static conditions. A pulsed 25 keV Bi⁺ primary ion source (Liquid Metal Ion Gun, LMIG) at a current of about 1 pA (high current bunched mode), rastered over a scan area of 500 × 500 μm was used as the analysis beam. Data acquisition and processing analyses were performed using the commercial IonSpec program. The exact mass values of at least seven known species, from H⁻, C⁻, C⁻₂, C⁻₃, PO₂⁻, PO₃⁻, FeO⁻, FeO₂⁻, Fe₂O⁻, FeOPO₃⁻, and H⁺, CH₃⁺, Na⁺, Ca⁺, Fe₂⁺, C₅H₅Fe⁺, C₆H₆Fe⁺, were used for calibration of the data, acquired in the negative and positive ion mode, respectively.

Campbell V.E., Tonelli M., Cimatti I., Moussy J.B., Tortech L., Dappe Y.J., Rivière E., Guillot R., Delprat S., Mattana R., Seneor P., Ohresser P., Choueikani F., Otero E., Koprowiak F., Chilkuri V.G., Suaud N., Guihéry N., Galtayries A., Miserque F., Arrio M.A., Sainctavit P, & Mallah T. (2016). Engineering the magnetic coupling and anisotropy at the molecule–magnetic surface interface in molecular spintronic devices. Nature Communications, 7, 13646.

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Atomic-Scale Imaging of Halogenated Precursors

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All experiments were conducted using commercial UHV system (base pressure 2 × 10⁻¹⁰ mbar) equipped with a variable temperature scanning tunneling microscope (SPECS, Aarhus 150), a molecular evaporator, a metal evaporator and standard facilities for sample preparation. The single-crystalline Au(111) surfaces were cleaned by cycles of argon-ion sputtering and annealing. Imaging was performed in constant current mode, with the bias voltage given with respect to the sample at ~120 K. The precursor ICBP was deposited through a leak valve onto the substrates. Precursors Br-TPP, Br₂-TPP, Br₄-TPP, and Br₆-B₁₀ were evaporated from a quartz crucible onto metal/semimetal surfaces, and the sublimation temperatures for precursors Br-TPP, Br₂-TPP, Br₄-TPP, and Br₆-B₁₀ were 165, 175, 185, and 230 °C, respectively. Palladium atoms were dosed by electron beam evaporation from a Pd rod. ToF-SIMS experiments were performed using a ToF-SIMS V spectrometer (IONTOF GmbH, Münster, Germany). A pulsed 30 keV Bi₃⁺ ion beam was used as the primary ion beam for all measurements. The analysis area was 500 × 500 μm. Target current was 1 pA. All data were obtained and analyzed using the IONTOF instrument software. Positive mass spectra were calibrated using C⁺, CH⁺, CH₂⁺, and C₂⁺ peaks.

Li D.Y., Li S.W., Xie Y.L., Hua X., Long Y.T., Wang A, & Liu P.N. (2019). On-surface synthesis of planar dendrimers via divergent cross-coupling reaction. Nature Communications, 10, 2414.

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