was characterized using an atomic force microscope (AFM, Nanoscope
V Dimension 3100 microscope, Veeco, United States) using a tapping
mode approach in air (DNP-10 tip). The features were analyzed using
NanoScope Analysis software.
The Nanoscope V Dimension 3100 microscope is a scanning probe microscope designed for high-resolution imaging and surface characterization. It offers precise nanoscale measurement capabilities, enabling users to visualize and analyze the topography and properties of a wide range of materials and samples.
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