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Nanoscope 5 dimension 3100 microscope

Manufactured by Veeco
Sourced in United States

The Nanoscope V Dimension 3100 microscope is a scanning probe microscope designed for high-resolution imaging and surface characterization. It offers precise nanoscale measurement capabilities, enabling users to visualize and analyze the topography and properties of a wide range of materials and samples.

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5 protocols using nanoscope 5 dimension 3100 microscope

1

Atomic Force Microscopy Topography Analysis

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Topography
was characterized using an atomic force microscope (AFM, Nanoscope
V Dimension 3100 microscope, Veeco, United States) using a tapping
mode approach in air (DNP-10 tip). The features were analyzed using
NanoScope Analysis software.
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2

Tapping Mode AFM Imaging

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AFM images were obtained using a commercial atomic force microscope (Nanoscope V Dimension 3100 microscope, Veeco, USA) operating with the tapping mode in air.
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3

Fabrication of Wrinkled PDMS Substrates

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PDMS substrates were generated as described previously (Zhou et al., 2015 (link), Zhou et al., 2016 ). In brief, PDMS pre-polymer and crosslinker (Sylgard 184; Dow Corning) were mixed in 10:1 ratio (w/w). PDMS substrates (9.5 × 9.5 cm, ∼1.5 mm thickness) were then stretched uniaxially to 130% of their original length. The samples were oxidized between 60 and 500 s in air plasma under pressure of 14 torr (0.2 mbar; Plasma Activate Flecto 10 USB). Removal of strain evoked wrinkle formation of different periodicities and height depending on the oxidation time. All samples were post-treated with air plasma for 10 min to ensure equal oxidation and Young's modulus values (62 MPa). AFM profiles were obtained using a Nanoscope V Dimension 3100 microscope (Veeco), whereas the stiffness analysis was performed on a Catalyst Nanoscoop V instrument (Bruker). Bruker SCANASYST-AIR (0.4 N m−1) and NP (0.017 N m−1) cantilevers made from silicon nitride with silicon tips were used before each measurement.
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4

Characterizing Surface Topography using AFM

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Topography features were characterized by an atomic force microscope (AFM) (Nano-scope V Dimension 3100 microscope, Veeco, United States) operating in tapping mode in air. Bruker SCANASYST-AIR (0.4 N m−1) and NP (0.017 N m−1) cantilevers made from silicon nitride with silicon tips (model DNP-10 tip) were used for the measurements. The wavelength and amplitude of the topographies were determined using nanoscope analysis software.
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5

Topographic Characterization of MSC Culture

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Topography features were characterized by atomic force microscope (Nanoscope V Dimension 3100 microscope, Veeco, United States) operating in tapping mode in air (model DNP-10 tip). To determine the wavelength and amplitude of the topographies, the obtained AFM images were analyzed using NanoScope Analysis software.
Cell culture hBM-MSCs ( passage 2) were obtained from Lonza and cultured in growth medium containing Alpha modified Eagle medium (Gibco), 10% (v/v) fetal bovine serum (Gibco), 0.1% ascorbic acid 2-phosphate (Sigma) and 1% penicillin/streptomycin (Gibco). Cells were incubated in T75 culture flasks at 37 °C in a humidified atmosphere with 5% CO 2 . Culture medium was changed every 3 days and cells were harvested at ≈80% confluency. The confluent cells were routinely subcultured by trypsinization. MSCs of passage 4 were used for seeding onto the topographies and the differentiation experiments.
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