Observer z1 apotomemicroscope

Product characterization in powder form used: powder X-ray diffraction (XRD) in a Shimadzu XRD-6000 (Kyoto, Japan); scanning electron microscopy (SEM) in a Shimadzu SSX-550 microscope (Kyoto, Japan); and Fourier transform infrared spectroscopy (FT-IR) in a Thermo Scientific Smart OMNI-Sampler Nicolet iS10 FT-IR Spectrometer (Massachusetts, USA). Compounds were also restituted and analyzed by FT-IR, transillumination in Gel logic 200 Kodak (New York, USA) and fluorescence microscopy in a ZEISS Observer Z.1 Apo Tome microscope (Oberkochen, Germany).
The XRD used CuKα with 30 kV voltage and 30 mA current, a Ni filter and data collected in a 2θ range between 3-40 degrees. For SEM, samples were previously coated in gold with a metallizer with a 10 mA current for 5 minutes. FT-IR used attenuated total reflectance (ATR) with a wavenumber range between 4000 and 750 cm^-1. For fluorescence microscopy, samples were fixed in slides using ethanol. Transillumination used a wavelength of 306 nm, and powders were restituted in their respective solvents. Because of the maintenance of powders’ characteristics, fluorescence microscopy analyses and FT-IR of restituted powders SbQ-R was used as a model.