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Ultim max 100

Manufactured by Oxford Instruments
Sourced in United Kingdom

The Ultim Max 100 is an X-ray detector designed for use in various analytical applications. It features a sensitive and efficient silicon drift detector (SDD) technology, providing high-resolution X-ray spectroscopy capabilities. The Ultim Max 100 is suitable for diverse applications that require accurate X-ray analysis.

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12 protocols using ultim max 100

1

SEM and EDX Characterization of Coated Samples

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Images and maps were measured with a Gemini 1550 SEM (Zeiss, Germany) and an EDX detector Ultim Max 100 (Oxford Instruments, UK) at an acceleration voltage of 10 kV. Samples were coated with 18 nm titanium using a Precision Etching Coating System Model 682 (GATAN, United States) prior to SEM observation and EDX studies.
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2

Comprehensive Characterization of Thin Film Coatings

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The x-ray diffraction (XRD) pattern obtained from a Bruker D8 Advance diffractometer (monochromatic Cu Kα x-ray, wavelength=1.5418 Å) was used to identify the structure of the particles. X-ray photoelectron spectroscopy (XPS; PHI VersaProbe III with a monochromatic Al Kα source of 1486.6 eV) was employed to assess the chemical composition of the surface of the film. Scanning electron microscopy (JEOL JSM-IT500) and atomic force microscopy (Asylum Research 3D MFP) were utilized to examine the coating morphology and roughness respectively. ImageJ software was employed to obtain the synthesized particle size distribution through SEM images. Surface composition was assessed using electron-dispersive X-ray spectroscopy (Oxford Instruments Ultim Max 100). Optical absorbance and transmittance were measured using an Agilent model 8453 UV-VIS spectrometer. The wettability of the coatings was assessed from the contact angle (First Ten Angstroms FTA125) of 10 μL of DI water.
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3

Microstructural Analysis of RPC Mixtures

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The thin cross sections of the RPC specimens were first cut with a diamond saw from the specimens used for the testing of the mechanical properties. These specimens were then flooded with epoxy resin and polished until a highly polished surface was obtained. Then, they were analyzed with JEOL JSM-7600F at 15 kV. The Ultim Max 100 (Oxford Instruments, Abingdon-on-Thames, UK) EDS spectrometer was used for the EDS analysis of RPC mixtures with the addition of silica fume. The elemental maps showing the distribution of the significant chemical elements (Al, Ca, and Si) based on the EDS measurement were prepared.
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4

Characterizing Secondary-Phase Mineral Precipitation

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A field emission scanning electron microscope (FE-SEM; Gemini500, Zeiss, Germany) with energy dispersive X-ray spectroscopy (Ultim max100, Oxford Instruments, United Kingdom), operating at a working distance of 10 mm and 15°keV, was used to observe the precipitation of secondary-phase minerals. SEM specimens were prepared following a method to improve their image resolution and elemental composition (Dong et al., 2003a (link)). The prepared specimens were air-dried for 24 h prior to Pt coating 10 nm in thickness.
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5

Electrospun Membrane Characterization

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The electrospun membranes were examined using an FE-SEM microscope (Apreo 2, Thermo Scientific, Waltham, MA, USA) to evaluate their surface morphology. The samples were sputter coated with gold-palladium (Quorum Technologies Ltd, Q150T S plus, Lewes, UK) for conductivity purposes before analysis. The samples were captured at different magnifications at an acceleration voltage of 20 kV. Elemental analysis of the different electrospun membranes was performed using the EDX attachment of the SEM (Oxford Instruments Ultim Max 100, Abingdon, UK).
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6

Characterization of PEEK-TiO2 Composites

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We used an energy dispersive spectrometer (EDS) (Ultim Max 100, Oxford Instruments, Abingdon-on-Thames, UK) to conduct a semi-quantitative analysis of carbon (C), oxygen (O), and titanium (Ti) elements in the PEEK matrix after surface polishing to confirm the presence and distribution of the TiO2 particles for each group. After compression tests, the macroscopic fracture morphology of the PEEK crowns was first visually observed. To assess the fracture characteristics, the fracture surfaces were coated with a 25 nm thick conductive platinum film, and the microscopic fracture morphology was observed using scanning electron microscopy (SEM) (JSM-6500F, JEOL, Tokyo, Japan).
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7

Microstructural Analysis of 3D Printed Samples

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The microstructure
of the samples is characterized by a SEM (IT-500HR; JEOL) instrument
equipped with an EDS detector (Ultim Max100; Oxford Instruments).
To analyze the cross section, the sample is submerged in a glass dish
filled with liquid nitrogen for 120 s and cut along the printing direction
with a scalpel blade. The images were collected in backscattered electron
(BSE) mode under low vacuum (50 Pa). The colormap is built from the
EDS scanning on the cross-sectional surface to analyze the element
distribution.
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8

Advanced Characterization of Materials

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Powder X-ray diffraction (XRD) was performed using a Rigaku SmartLab 3 diffractometer with Cu Kα radiation (λ = 1.5418 Å). Scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) spectroscopy were carried out using a scanning electron microscope Supra 25 (Carl Zeiss AG) equipped with a silicon drift detector Ultim Max 100 (Oxford Instruments). Fourier-transform infrared (FTIR) spectra were recorded with a Shimadzu IRTracer-100 spectrometer using an ATR accessory with a diamond window.
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9

Fracture Analysis of PEEK Crowns

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The macroscopic fracture appearance of the fractured PEEK crowns was observed visually. To observe the microscopic fracture pattern of PEEK crowns, the non-conductive fracture surface was analyzed using a scanning electron microscope (SEM) (JSM-6500F, JEOL, Tokyo, Japan) with secondary electron image mode and 15 kV acceleration voltage after being coated with a thin (~10 nm) conductive platinum film. Meanwhile, an energy dispersive spectrometer (EDS) (Ultim Max 100, Oxford Instruments, Abingdon-on-Thames, UK) with mapping analysis mode was used to analyze the elemental distribution of titanium (Ti), oxygen (O), and carbon (C) on the fracture surface to confirm the dispersion of TiO2 particles in the PEEK matrix. Furthermore, the crystallinity of the fracture surface was analyzed using a high-intensity X-ray micro-area diffractometer (D8 Discover, Brucker, Billerica, MA, USA) with beam sizes down to 180 × 180 μm2 to investigate the crystalline structure of test PEEK crowns. The measured 2θ ranged from 10 to 80°, with a scanning rate of approximately 1° per minute.
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10

Characterizing Magnetic Fiber Properties

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The mechanical properties of the fibers were measured using an extensometer (Quasar 2.5 single column, Galdabini, Cardano al Campo, Italy) with a 1 kN load cell with a deformation rate of 3 mm min−1. To measure the magnetic strength of the fibers, a permanent magnet (NdFeB, 35 N grade, 50 × 10 × 5 mm3) was fixed under the top load cell of the extensometer, and placed a fiber measuring 5 cm in length at the bottom of the load cell. The magnet was approached to the fiber until the fiber was adhered to the magnet. We measured this maximum distance and calculated the mean value and standard deviation to define the maximum effective distance as the magnetic strength. The surface elements and topographies of liquid metal and magnetic liquid metal were characterized by scanning electron microscopy (SEM, SUPRA40VP SEM, Carl Zeiss, Oberkochen, Germany) and energy dispersive spectrometry (EDS, Ultim Max 100, Oxford Instruments, Abingdon, UK).
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