Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.90, Tmax = 0.95
11331 measured reflections
3063 independent reflections
2538 reflections with I > 2σ(I)
Rint = 0.031
The D8 VENTURE PHOTON 100 CMOS diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It utilizes a CMOS (Complementary Metal-Oxide-Semiconductor) detector to collect diffraction data from crystalline samples. The core function of this diffractometer is to determine the structure of materials by analyzing the patterns of X-ray diffraction.
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.90, Tmax = 0.95
11331 measured reflections
3063 independent reflections
2538 reflections with I > 2σ(I)
Rint = 0.031
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2013 ▶ ) Tmin = 0.87, Tmax = 0.96
13492 measured reflections
3243 independent reflections
3122 reflections with I > 2σ(I)
Rint = 0.030
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.84, Tmax = 0.96
12558 measured reflections
3247 independent reflections
2529 reflections with I > 2σ(I)
Rint = 0.042
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2012 ▶ ) Tmin = 0.84, Tmax = 0.96
32772 measured reflections
4560 independent reflections
3185 reflections with I > 2σ(I)
Rint = 0.105
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.86, Tmax = 0.92
28946 measured reflections
3495 independent reflections
3189 reflections with I > 2σ(I)
Rint = 0.030
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2012 ▶ ) Tmin = 0.83, Tmax = 0.95
16018 measured reflections
3531 independent reflections
3255 reflections with I > 2σ(I)
Rint = 0.035
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2013 ▶ ) Tmin = 0.76, Tmax = 0.84
17510 measured reflections
2951 independent reflections
2769 reflections with I > 2σ(I)
Rint = 0.023
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.77, Tmax = 0.82
10355 measured reflections
2683 independent reflections
2515 reflections with I > 2σ(I)
Rint = 0.021
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.63, Tmax = 0.97
7079 measured reflections
7079 independent reflections
6072 reflections with I > 2σ(I)
Bruker D8 VENTURE PHOTON 100 CMOS diffractometer
Absorption correction: numerical (SADABS; Bruker, 2014 ▸ ) Tmin = 0.54, Tmax = 0.77
12901 measured reflections
3428 independent reflections
3113 reflections with I > 2σ(I)
Rint = 0.025
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