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D8 venture photon 100 cmos diffractometerabsorption

Manufactured by Bruker

The D8 VENTURE PHOTON 100 CMOS diffractometer is a laboratory instrument designed for X-ray diffraction analysis. It utilizes a CMOS (Complementary Metal-Oxide-Semiconductor) detector to collect diffraction data from crystalline samples. The core function of this diffractometer is to determine the structure of materials by analyzing the patterns of X-ray diffraction.

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Lab products found in correlation

33 protocols using d8 venture photon 100 cmos diffractometerabsorption

1

CMOS Diffractometer for Crystal Characterization

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.90, Tmax = 0.95

11331 measured reflections

3063 independent reflections

2538 reflections with I > 2σ(I)

Rint = 0.031

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2

Single Crystal X-ray Diffraction Analysis

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2013 ▶ ) Tmin = 0.87, Tmax = 0.96

13492 measured reflections

3243 independent reflections

3122 reflections with I > 2σ(I)

Rint = 0.030

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3

Bruker D8 VENTURE PHOTON 100 CMOS Diffractometry

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.84, Tmax = 0.96

12558 measured reflections

3247 independent reflections

2529 reflections with I > 2σ(I)

Rint = 0.042

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4

X-ray Diffraction Analysis Protocol

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2012 ▶ ) Tmin = 0.84, Tmax = 0.96

32772 measured reflections

4560 independent reflections

3185 reflections with I > 2σ(I)

Rint = 0.105

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5

Single-Crystal X-ray Diffraction Analysis

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.86, Tmax = 0.92

28946 measured reflections

3495 independent reflections

3189 reflections with I > 2σ(I)

Rint = 0.030

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6

Single-Crystal X-ray Diffraction Analysis

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2012 ▶ ) Tmin = 0.83, Tmax = 0.95

16018 measured reflections

3531 independent reflections

3255 reflections with I > 2σ(I)

Rint = 0.035

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7

Single Crystal X-ray Diffraction Analysis

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2013 ▶ ) Tmin = 0.76, Tmax = 0.84

17510 measured reflections

2951 independent reflections

2769 reflections with I > 2σ(I)

Rint = 0.023

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8

X-Ray Diffraction Analysis of Crystalline Sample

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.77, Tmax = 0.82

10355 measured reflections

2683 independent reflections

2515 reflections with I > 2σ(I)

Rint = 0.021

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9

Crystal structure determination protocol

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: multi-scan (SADABS; Bruker, 2014 ▸ ) Tmin = 0.63, Tmax = 0.97

7079 measured reflections

7079 independent reflections

6072 reflections with I > 2σ(I)

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10

Single Crystal X-ray Diffraction Protocol

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Bruker D8 VENTURE PHOTON 100 CMOS diffractometer

Absorption correction: numerical (SADABS; Bruker, 2014 ▸ ) Tmin = 0.54, Tmax = 0.77

12901 measured reflections

3428 independent reflections

3113 reflections with I > 2σ(I)

Rint = 0.025

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