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Xd 3a

Manufactured by Shimadzu
Sourced in Japan

The Shimadzu XD-3A is a laboratory equipment designed for analytical purposes. It serves as a precision measurement tool, though its core function and intended use are not specified in this description.

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9 protocols using xd 3a

1

Structural Analysis of CDPAC

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XRD patterns
of CDPAC samples were recorded on a Shimadzu XD-3A (Japan)
goniometer, using Cu Kα radiation operated at 40 kV and 35 mA.
Surface morphology analysis of CDPAC was performed using a Quanta
200 FEG high-resolution scanning electron microscope and an FEI Tecnai
G20 high-resolution transmission electron microscope instrument. The
adsorption–desorption isotherms were obtained using a Quantachrome
Autosorb-1 volumetric analyzer, and the specific surface area was
determined by the BET method.
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2

Characterization of Cefotaxime-Loaded Silver Nanoparticles

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The nature and size of the Cefotaxime-CS-AgNPs, CS-AgNPs or AgNPs have determined the usage of XRD. This became executed the use of Shimadzu XRD (Shimadzu XD-3A, Japan) and the analyzed AgNPs or Cefotaxime-CS-AgNPs turned into fine powder and the compositions were determined. Moreover, the size of Cefotaxime-CS-AgNPs, CS-AgNPs or AgNPs has calculated using Debye Scherer’s equation.
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\begin{document}
$$D\, = \,{{{\rm{k\lambda }}} \over {{\rm{\beta cos}}\,{\rm{\theta }}}}$$
\end{document}
where β is the width of the maximum peak at half of the height at the diffraction angle Ө, D is the average crystalline size of the Cefotaxime-CS-AgNPs, CS-AgNPs or AgNPs, k is a geometric factor (0.9) and λ is the X-ray radiation source wavelength.30 (link)
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3

Comprehensive Material Characterization Protocol

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The morphologies of the synthesized samples were examined on a Carl Zeiss Ultra Plus scanning electron microscopy (SEM), and their crystallographic structures were identified on an X-ray diffractor (XRD, Shimadzu XD–3A, Tokyo, Japan), which used filtered Cu-Kα radiation and operated at 40 kV and 30 mA. The internal structures of the samples were imaged on a transmission electron micrograph (TEM, JEOL, JEM-2000 FX) that was operated at 200 kV, and coupled energy dispersive spectroscopy (EDS) was used for the elemental analysis. The surface area and pore size distribution were measured on a Quantachrome Instrument (autosorb IQ) using N2 as the working gas. The functional groups present on the sample surfaces were studied by Fourier Transform infrared spectroscopy (FT-IR) recorded on a PerkineElmer spectrophotometer (FT-IR M-1700 2B). X-ray photoelectron spectroscopy (XPS) characterizations were carried out on a PHI Quantum 2000 XPS system with a monochromatic Al Kα source and a charge neutralizer. The X-ray photoelectron spectra of all the elements were referenced as the C 1s peak arising from adventitious carbon (its binding energy was set at 284.8 eV).
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4

Characterization of Photosensitizer Ce6 Formulation

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All reagents were of analytical grade and used without further purification. Solutions were prepared using ultra-pure water with a resistance of 18 MΩ cm by a Milli-Q system. 1,3-Diphenylisobenzofuran (DPBF) was purchased from Shanghai Titan Scientific CO., Ltd. Ce6 was bought from Frontier Scientific. The strain of S. aureus was CMCC 26003 purchased from the National Institutes for Food and Drug Control. PEI (branched, Mw = 25 000), 96-well cell culture plates, cell culture dishes and centrifuge tubes were obtained from Corning. The FT-IR and UV-Vis spectra were recorded using an Is10 FT-IR apparatus of Thermo Fisher in the spectral range of 400–4000 cm−1 and an UV-2600 UV-vis spectrophotometer in the wavelength range from 200 to 700 nm. The morphologies of the samples were characterized by a JSM-7500F field emission scanning electron microscope (SEM) and Tecnai G2 F20 S-TWIN field emission transmission electron microscope (TEM). Raman spectra were recorded on a LabRAM HR (Horiba, France) laser Raman spectrometer and X-ray powder diffraction was performed on XD-3A (Shimadzu).
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5

Comprehensive Material Characterization

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Scanning electron microscope (SEM, ULTRA plus, Carl Zeiss, Germany) was used to characterize the morphology, and X-ray diffraction (XRD, XD−3A, Shimadzu, Japan) was used to analyze the crystal structure and composition of the prepared materials (angle range: 5–90°, scanning rate: 5° min−1). X-ray photoelectron spectroscopy (XPS, VG Escalab210, VG Scientific, Britain) was carried out to analyze the electronic structure and composition of the prepared materials.
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6

AuNP Crystal Structure Analysis by XRD

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The AuNP crystal structure was interpreted using XRD (Shimadzu XD-3A, Tokyo, Japan).
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7

Crystalline Modifications in Gelatin Nanofibers

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The evaluation of crystalline modifications in the bovine, porcine, and fish gelatin nanofibers was performed using X-ray diffraction (XRD) (Shimadzu, XD3A, Japan). The XRD analysis was conducted at 40 kV and 40 mA, with a diffraction angle 2θ ranging from 5° to 90° in steps of 0.05°. The distance between consecutive layers of atoms, represented as d (Å), was calculated using Bragg’s Law (Eq. 6)32 (link). nRλ=2dsinθ where n is the reflection order (dimensionless), λ is X-ray wavelength (1.5418 Å), and θ is the angle of incidence (°).
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8

Characterization of ROE-AgNPs and Cefuroxime-ROE-AgNPs

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The ROE-AgNPs and Cefuroxime-ROE-AgNPs nature and size were determined using Shimadzu XRD (Shimadzu XD-3A, Tokyo, Japan). The radiation used was Cu Kα (0.154 nm) at 35 nm with a scanning rate of 2°/min and 40 kV. The nanoparticle size was determined using the formula of Debye–Scherrer [32 (link)].
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9

Characterization of Copper Nanoparticles

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The nature and size of the CME-CuNPs were determined using Shimadzu XRD (Shimadzu XD-3A, Japan). The nanoparticle size was calculated using the formula of Debye–Scherrer [29 (link)].
Fourier-transform infrared analysis (FTIR): The spectra of CME and CME-CuNPs were determined using a Shimadzu IR-470 Spectrometer (Shimadzu) in the range of 500–4,000 cm-1[30 (link)].
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