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Pe 2400 series 2 chns o

Manufactured by PerkinElmer
Sourced in United States

The PE 2400 series II CHNS/O is a combustion analyzer that can quantify the carbon, hydrogen, nitrogen, sulfur, and oxygen content in a variety of organic and inorganic samples. It utilizes a high-temperature combustion process to convert the sample into combustion gases that are then separated and detected by thermal conductivity.

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5 protocols using pe 2400 series 2 chns o

1

Elemental Analysis and Spectroscopy Methods

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Elemental analyses involving C, H, and N atoms were performed on a PE 2400 series II CHNS/O (PerkinElmer instruments, Shelton, CT, USA) or an Elementar Vario EL-III analyzer (Elementar Analysensysteme GmbH, Hanau, Germany). Infrared spectra were obtained from a JASCO FT/IR-460 plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg–Brentano X-ray powder diffractometer equipped with a CuKαα = 1.54178 Å) sealed tube (Bruker Corporation, Karlsruhe, Germany).
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2

Characterization of Cellulose Acetate and Ionic Liquid Composites

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A Fourier transform infrared spectrometer (Spectrum Two, PE company,
Waltham, Massachusetts, USA) was used to characterize the molecular
structures of CA and CA-ILs. The 1H NMR (400 MHz) spectra
were recorded on a JEOL LEOLEX-400 spectrometer with 16 scans in DMSO-d6 (LEOLEX-400, JOEL Japan). The content of the
nitrogen element in the grafted CA was measured using an organic elemental
analyzer (PE2400 SERIES II CHNS/O, PerkinElmer, Waltham, Massachusetts,
USA). The microstructures of the pure CA and CA-IL films were studied
by scanning electron microscopy (SEM) (JSM-6490, JOEL Japan). Mechanical
properties of the pure CA and CA-IL films were tested by a film tensile
testing machine (XLW(PC)-500 N, Sumspring, Jinan, China) at 25 °C.
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3

Comprehensive Characterization of Materials

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Elemental analyses of (C, H, N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL III analyzer (Elementar Analysensysteme GmbH, Hanau, German). Infrared spectra were obtained from a JASCO FT/IR-460 Plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Thermal gravimetric analyses (TGA) were carried out on an SII Nano Technology Inc. TG/DTA 6200 over the temperature range of 30 to 900 °C at a heating rate of 10 °C min−1 under N2 (SEIKO Instruments Inc., Chiba, Japan). UV–vis spectrum was performed on a UV-2450 spectrophotometer (Dongguan Hongcheng Optical Products Co., Dongguan, China). Emission spectra for the solid samples were determined with a Hitachi F-4500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Gas sorption measurements were conducted using a Micromeritics ASAP 2020 system (Micromeritics Instruments Co., Norcross, GA, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg-Brentano X-ray powder diffractometer equipped with a CuKα sealed tube (λα = 1.54178 Å) at 40 kV and 40 mA (Bruker Corporation, Karlsruhe, Germany).
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4

Elemental and Spectroscopic Analyses

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Elemental analyses (C, H, and N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL-III analyzer (Elementar Analysensysteme GmbH, Hanau, German). IR spectra (KBr disk) were measured on a JASCO FT/IR-460 plus spectrometer ((JASCO, Easton, MD, USA). Powder X-ray diffraction (PXRD) patterns were obtained from a Bruker D2 PHASER diffractometer (Bruker Corporation, Karlsruhe, Germany).
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5

Comprehensive Characterization of Materials

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Elemental analyses of (C, H, N) were performed on a PE 2400 series II CHNS/O (PerkinElmer Instruments, Shelton, CT, USA) or an Elementar Vario EL-III analyzer (Elementar Analysensysteme GmbH, Hanau, Germany). Infrared spectra were obtained from a JASCO FT/IR-460 plus spectrometer with pressed KBr pellets (JASCO, Easton, MD, USA). Powder X-ray diffraction patterns were carried out with a Bruker D8-Focus Bragg–Brentano X-ray powder diffractometer equipped with a CuKα (λα = 1.54178 Å) sealed tube (Bruker Corporation, Karlsruhe, Germany). The UV-Vis spectrum was performed on a UV-2450 spectrophotometer (Dongguan Hongcheng Optical Products Co., Dongguan, China). Emission spectra were determined with a Hitachi F-4500 fluorescence spectrophotometer (Hitachi, Tokyo, Japan). Energy dispersive X-ray (EDX) analysis was performed by using a JEOL JSM-7600F Ultra-High Resolution Schottky Field Emission Scanning Electron Microscope with Oxford Xmax80 energy dispersive X-ray spectrometer (JEOL, Ltd., Tokyo, Japan).
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